Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films

Applied Physics Letters

Volumn 83, Issue 1, 2003, Pages 51-53

  Goudeau, Philippe ^a   Villain, Pascale ^a   Tamura, Nobumichi ^b   Padmore, Howard A ^b  

^a UNIVERSITÉ DE POITIERS   (France)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUCKLING; COMPACTION; COMPRESSIVE STRESS; DELAMINATION; RESIDUAL STRESSES; STRESS RELAXATION; X RAY DIFFRACTION ANALYSIS;

COMPRESSED THIN FILMS;

THIN FILMS;

EID: 0042496211     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1591081     Document Type: Article

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