Sharper images by focusing soft X-rays with photon sieves

Nature

Volumn 414, Issue 6860, 2001, Pages 184-188

  Kipp, L ^a   Skibowski, M ^a   Johnson, R L ^b   Berndt, R ^a   Adelung, R ^a   Harm, S ^a   Seemann, R ^c  

^a UNIVERSITY OF KIEL   (Germany)

^b UNIVERSITY OF HAMBURG   (Germany)

^c Niedmers and Seemann European Patent Attorneys   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING; FREE ELECTRON LASERS; PHOTONS; SYNCHROTRONS; X RAY DIFFRACTION; X RAY MICROSCOPES; X RAY SPECTROSCOPY; X RAYS;

FRESNEL ZONE PLATES;

IMAGING SYSTEMS;

X-RAY;

ARTICLE; GERMANY; IMAGE QUALITY; PHOTON; PRIORITY JOURNAL; SYNCHROTRON; X RAY; X RAY DIFFRACTION;

EID: 0035829623     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/35102526     Document Type: Article

References (9)

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4. Zone Plates for X-ray Microscopy Vol. 43 X-ray Microscopy
5. Process optimization for production of sub-20 nm soft X-ray zone plates
6. Digital Filters and their Applications Vol.4 Techniques of Physics