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Physical Review Letters

Volumn 89, Issue 8, 2002, Pages 088303/1-088303/4

High resolution 3D X-ray diffraction microscopy

(6) Miao, Jianwei a Ishikawa, Tetsuya b Johnson, Bart a Anderson, Erik H c Lai, Barry d Hodgson, Keith O a,e

a SLAC NATIONAL ACCELERATOR LABORATORY (United States)

b SPring 8/RIKEN ^* (Japan)

c LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

d ARGONNE NATIONAL LABORATORY (United States)

e STANFORD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ATOMIC PHYSICS; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; NICKEL;

IMAGING RECONSTRUCTION ALGORITHMS; OVERSAMPLING PHASING METHOD; X RAY DIFFRACTION MICROSCOPY;

X RAY DIFFRACTION ANALYSIS;

MICROSCOPY; PROCEDURES; X RAY DIFFRACTION;

MICROSCOPY; X-RAY DIFFRACTION;

EID: 4143054423 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.89.088303 Document Type: Article

Times cited : (322)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.