Microbeam high angular resolution x-ray diffraction in InGaNGaN selective-area-grown ridge structures

Applied Physics Letters

Volumn 89, Issue 18, 2006, Pages

  Sirenko, A A ^a   Kazimirov, A ^b   Cornaby, S ^b   Bilderback, D H ^b   Neubert, B ^c   Bruckner P ^c   Scholz, F ^c   Shneidman, V ^a   Ougazzaden, A ^d  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b Department of Obstetrics Gynecology   (United States)

^c UNIVERSITY OF ULM   (Germany)

^d GEORGIA INSTITUTE OF TECHNOLOGY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONFORMAL MAPPING; DIFFUSION; MATHEMATICAL MODELS; METALLORGANIC VAPOR PHASE EPITAXY; SEMICONDUCTING INDIUM COMPOUNDS;

MICROBEAM HIGH ANGULAR RESOLUTION; PHASE DIFFUSION MODEL; RECIPROCAL SPACE MAPPING; THICKNESS ENHANCEMENT;

X RAY DIFFRACTION;

EID: 33750708579     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2378558     Document Type: Article

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