Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction

Journal of Applied Crystallography

Volumn 41, Issue 2, 2008, Pages 272-280

  Chamard, Virginie ^a   Stangl, Julian ^b   Labat, Stephane ^a   Mandl, Bernhard ^c   Lechner, Rainer T ^b   Metzger, Till H ^d  

^a CNRS   (France)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^c LUND UNIVERSITY   (Sweden)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Coherent X ray diffraction; InAs; Micro focusing; Nanowires; Stacking faults; Synchrotron radiation

Indexed keywords

EID: 40849094335     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889808001167     Document Type: Article

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