Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction

Applied Physics Letters

Volumn 94, Issue 2, 2009, Pages

  Scheler, T ^a   Rodrigues, M ^a   Cornelius, T W ^a   Mocuta, C ^a   Malachias, A ^a   Magalhaes Paniago R ^a   Comin, F ^a   Chevrier, J ^a,b   Metzger, T H ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; DIFFRACTION; ELASTICITY; LATTICE CONSTANTS; NANOSTRUCTURES; X RAY ANALYSIS; X RAY DIFFRACTION;

ATOMIC FORCES; DIFFUSE SCATTERINGS; ELASTIC PROPERTIES; IN SITU ATOMIC FORCE MICROSCOPIES; IN-SITU; LATTICE PARAMETER CHANGES; LATTICE PARAMETERS; NANOSCALE OBJECTS; NOVEL TECHNIQUES; X-RAY DIFFRACTIONS;

ATOMIC FORCE MICROSCOPY;

EID: 58349114312     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3067988     Document Type: Article

References (12)

1. J. Stangl, V. Hol, and G. Bauer, Rev. Mod. Phys. 76, 725 (2004).
2. G. Rubio-Bollinger, S. R. Bahn, N. Agrat, K. W. Jacobsen, and S. Vieira, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.87.026101 87, 026101 (2001). Elastic properties of Ge nanostructures in the ultrasonic regime have already been studied by O. V. Kolosov, M. R. Castell, C. D. Marsh, G. A. D. Briggs, T. I. Kamins, and R. Stanley Williams, Phys. Rev. Lett. 81, 1046 (1998).
3. A. Saito, Y. Takagi, K. Takahashi, H. Hosokawa, K. Hanai, T. Tanaka, M. Akai-kasaya, Y. Tanaka, S. Shin, T. Ishikawa, Y. Kuwaharaa, and M. Aono, Surf. Interface Anal. 0142-2421 40, 1033 (2008); V. Rose, J. W. Freeland, K. E. Gray, and S. K. Streiffer, Appl. Phys. Lett. 92, 193510 (2008).
4. See, e.g., T. U. Schülli, J. Stangl, Z. Zhong, R. T. Lechner, M. Sztucki, T. H. Metzger, and G. Bauer, Phys. Rev. Lett. 90, 066105 (2003).
5. A. Snigirev, V. Kohn, I. Snigireva I, and B. Lengeler, Nature (London) 384, 49 (1996).
6. W. C. Oliver and G. M. Pharr, J. Mater. Res. 19, 3 (2004).
7. O. Dhez, M. Rodrigues, F. Comin, R. Felici, and J. Chevrier, AIP Conf. Proc. 879, 1391 (2007).
8. C. Mocuta, J. Stangl, K. Mundboth, T. H. Metzger, G. Bauer, I. A. Vartanyants, M. Schmidbauer, and T. Boeck, Phys. Rev. B 77, 245425 (2008).
9. M. Hanke, M. Dubslaff, M. Schmidbauer, T. Boeck, S. Schöder, M. Burghammer, C. Riekel, J. Patommel, and C. G. Schroer, Appl. Phys. Lett. 92, 193109 (2008).
10. H. Hertz, J. Reine Angew. Math. 92, 156 (1882).
11. M. S. Rodrigues, T. W. Cornelius, T. Scheler, C. Mocuta, A. Malachias, R. Magalhães-Paniago, O. Dhez, F. Comin, T. H. Metzger, and J. Chevrier (unpublished).
12. See EPAPS Document No. E-APPLAB-94-030902 for a full series of diffraction patterns. For more information on EPAPS, see http://www.aip.org/ pubservs/epaps.html.