Coherent X-ray diffraction imaging of strain at the nanoscale

Nature Materials

Volumn 8, Issue 4, 2009, Pages 291-298

  Robinson, Ian ^a,b   Harder, Ross ^c  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); NANOCRYSTALLINE MATERIALS; NANOCRYSTALS; SYNCHROTRON RADIATION;

ACTIVE DEVICES; COHERENT X-RAY DIFFRACTION IMAGING; DESIGN AND IMPLEMENTATIONS; STRAIN PROPERTIES; SURFACES AND INTERFACES; SYNCHROTRON RADIATION SOURCE; THREE DIMENSIONAL IMAGES; X-RAY DIFFRACTION TECHNIQUES;

X RAY DIFFRACTION;

EID: 63049089080     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat2400     Document Type: Review

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