X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates

Nature Materials

Volumn 2, Issue 7, 2003, Pages 487-492

  Budai, John D ^a   Yang, Wenge ^a   Tamura, Nobumichi ^b   Chung, Jin Seok ^c   Tischler, Jonathan Z ^a   Larson, Bennett C ^a   Ice, Gene E ^a   Park, Chan ^d   Norton, David P ^e  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c Soongsil University   (South Korea)

^d Korea Electrotechnology Research Institute (KERI)   (South Korea)

^e University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTALLOGRAPHY; PERCOLATION (SOLID STATE); POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; REACTION KINETICS; SUBSTRATES; SYNCHROTRON RADIATION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CERIUM OXIDE FILM; OXIDE FILM; STRAIN TENSOR; SYNCHROTRON X RAY MICROBEAMS; X RAY MICRODIFFRACTION;

CERIUM COMPOUNDS;

CERIC OXIDE; CERIUM; METAL; OXIDE;

ARTICLE; CHEMISTRY; X RAY CRYSTALLOGRAPHY;

CERIUM; CRYSTALLOGRAPHY, X-RAY; METALS; OXIDES;

EID: 0043267489     PISSN: 14761122     EISSN: None     Source Type: Journal    
DOI: 10.1038/nmat916     Document Type: Article

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