Focusing analysis of the pinhole photon sieve: Individual far-field model

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 19, Issue 12, 2002, Pages 2387-2393

  Cao, Qing ^a   Jahns, Jürgen ^a  

^a UNIVERSITY OF HAGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; PHASE SHIFT; PHOTONS; X RAYS;

PINHOLE PHOTON SIEVES;

DIFFRACTIVE OPTICS;

EID: 0042405019     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.19.002387     Document Type: Article

References (7)

1. G. Schmahl, D. Rudolph, P. Guttmann, and O. Christ, "Zone plates for x-ray microscopy," in X-Ray Microscopy, G. Schmahl and D. Rudolph, eds. (Springer-Verlag, Berlin, 1984), Vol. 43, pp. 63-74.
2. E. H. Anderson, V. Boegli, and L. P. Muray, "Electron beam lithography digital pattern generator and electronics for generalized curvilinear structures," J. Vac. Sci. Technol. B 13, 2529-2534 (1995).
3. L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and R. Seemann, "Sharper images by focusing soft x-rays with photon sieve," Nature (London) 414, 184-188 (2001).
4. See, for example, R. K. Tyson, Principles of Adaptive Optics, 2nd ed. (Academic, Boston, Mass., 1998), Subsect. 5.3.2.
5. Y-T. Wang, Y. C. Pati, and T. Kailath, "Depth of focus and the moment expansion," Opt. Lett. 20, 1841-1843 (1995).
6. J. I. García-Sucerquia, R. Castañeda, F. F. Medina, and G. Matteucci, "Distinguishing between Fraunhofer and Fresnel diffraction by the Young's experiment," Opt. Commun. 200, 15-22 (2001).
7. M. Abramowitz and I. A. Stegun, eds., Handbook of Mathematical Functions with Formulas, Graphs, and Mathematical Tables (Wiley, New York, 1972).