Three-dimensional mapping of a deformation field inside a nanocrystal

Nature

Volumn 442, Issue 7098, 2006, Pages 63-66

  Pfeifer, Mark A ^a,b   Williams, Garth J ^a,c   Vartanyants, Ivan A ^a,d   Harder, Ross ^a   Robinson, Ian K ^a,e  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF OREGON   (United States)

^c UNIVERSITY OF MELBOURNE   (Australia)

^d DESY   (Germany)

^e UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTALLINE MATERIALS; DEFORMATION; IMAGING SYSTEMS; THREE DIMENSIONAL; X RAY DIFFRACTION;

GRAIN INTERACTIONS; NANOCRYSTALS; SINGLE-MOLECULE IMAGING; THREE-DIMENSIONAL IMAGING;

NANOSTRUCTURED MATERIALS;

NANOCRYSTAL; SILICON DIOXIDE;

IMAGING METHOD; MAPPING METHOD; MICROSCOPY; MOLECULAR ANALYSIS; THREE-DIMENSIONAL FLOW; X-RAY DIFFRACTION;

ARTICLE; CRYSTAL STRUCTURE; CRYSTALLIZATION; DIFFRACTION; LASER; MELTING POINT; MICROSCOPY; MORPHOLOGY; PRIORITY JOURNAL; THREE DIMENSIONAL IMAGING; VACUUM; X RAY DIFFRACTION;

EID: 33745992278     PISSN: 00280836     EISSN: 14764687     Source Type: Journal    
DOI: 10.1038/nature04867     Document Type: Article

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