Submicrometer hard X-ray focusing using a single-bounce ellipsoidal capillary combined with a Fresnel zone plate

Journal of Synchrotron Radiation

Volumn 14, Issue 2, 2007, Pages 227-228

  Snigirev, A ^a   Bjeoumikhov, A ^b   Erko, A ^c   Snigireva, I ^a   Grigoriev, M ^d   Yunkin, V ^d   Erko, M ^b   Bjeoumikhova, S ^e  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b IFG Institute for Scientific Instruments GbmH   (Germany)

^c HAHN MEITNER INSTITUT   (Germany)

^d INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

^e BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

Fresnel zone plate; Hard X ray focusing; Single bounce capillary

Indexed keywords

BENDING (DEFORMATION); DEMAGNETIZATION; ELLIPSOMETRY; NANOTECHNOLOGY;

FRESNEL ZONE PLATE (FZP); HARD X-RAY FOCUSING; NANOFOCUSING DEVELOPMENTS; SINGLE-BOUNCE CAPILLARY;

X RAY SCATTERING;

EID: 33847734752     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049507004050     Document Type: Article

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