The future of integrated circuits: A survey of nanoelectronics

Proceedings of the IEEE

Volumn 98, Issue 1, 2010, Pages 11-38

  Haselman, Michael ^a   Hauck, Scott ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Microassembly; Nanotechnology; Reconfigurable architectures; Self testing

Indexed keywords

COMPUTER SOFTWARE; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONICS INDUSTRY; FAULT TOLERANCE; INTEGRATED CIRCUITS; NANOTECHNOLOGY; RECONFIGURABLE ARCHITECTURES; TIMING CIRCUITS;

ASSEMBLY TECHNIQUES; BISTABLE SWITCHES; FAULT TOLERANCE TECHNIQUES; MICRO ASSEMBLY; MOLECULAR-SCALE DEVICES; NANOSCALE ELECTRONICS; SELF-TESTING; TRANSIENT FAULTS;

NANOELECTRONICS;

EID: 72949107607     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPROC.2009.2032356     Document Type: Article

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