Crossbar demultiplexers for nanoelectronics based on n-Hot Codes

IEEE Transactions on Nanotechnology

Volumn 4, Issue 2, 2005, Pages 249-254

  Snider, Greg S ^a   Robinett, Warren ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

Demultiplexing; Encoding; Fault tolerance; Nanotechnology

Indexed keywords

ALGORITHMS; CODES (SYMBOLS); CROSSBAR EQUIPMENT; ENCODING (SYMBOLS); FIELD EFFECT TRANSISTORS; MATHEMATICAL MODELS; NANOTECHNOLOGY;

CROSSBAR DEMULTIPLEXERS; DEFECT TOLERANCE; LINEAR CODES; NANOELECTRONICS;

DEMULTIPLEXING;

EID: 15844416561     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2004.837853     Document Type: Article

References (12)

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