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Volumn 80, Issue 6, 2005, Pages 1183-1195

Nanoelectronic architectures

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTATIONAL METHODS; COMPUTER SIMULATION; CROSSBAR EQUIPMENT; LITHOGRAPHY; LOGIC GATES; MICROPROCESSOR CHIPS; NANOSTRUCTURED MATERIALS; SEMICONDUCTOR DIODES; TRANSISTORS;

EID: 16244364411     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-3154-4     Document Type: Article
Times cited : (94)

References (58)
  • 1
    • 84964961806 scopus 로고    scopus 로고
    • Fault tolerant design of combinational and sequential logic based on a parity check code
    • 3-5 November , Boston, MA, USA
    • S. Almukhaizim, Y. Makris: 'Fault Tolerant Design of Combinational and Sequential Logic Based on a Parity Check Code'. In: Proc. 18th IEEE Int. Symp. Defect and Fault Tolerance in VLSI Systems, 3-5 November 2003, Boston, MA, USA, pp. 563-570
    • (2003) Proc. 18th IEEE Int. Symp. Defect and Fault Tolerance in VLSI Systems , pp. 563-570
    • Almukhaizim, S.1    Makris, Y.2
  • 2
    • 84944215733 scopus 로고    scopus 로고
    • Evaluation of a soft error tolerance technique based on time and/or space redundancy
    • 18-24 September , Manaus, Brazil
    • L. Anghel, D. Alexandrescu, M. Nicolaidis: 'Evaluation of a Soft Error Tolerance Technique Based on Time and/or Space Redundancy'. In: Proc. 13th Symp. Integrated Circuits and Systems Design, 18-24 September 2000, Manaus, Brazil, pp. 237-242
    • (2000) Proc. 13th Symp. Integrated Circuits and Systems Design , pp. 237-242
    • Anghel, L.1    Alexandrescu, D.2    Nicolaidis, M.3
  • 7
    • 16244402248 scopus 로고    scopus 로고
    • Configurable nanoscale crossbar electronic circuits made by electrochemical reaction, US Patent No. 6 518 156
    • Y. Chen, R.S. Williams: Configurable nanoscale crossbar electronic circuits made by electrochemical reaction, US Patent No. 6 518 156 (2003)
    • (2003)
    • Chen, Y.1    Williams, R.S.2
  • 12
    • 84949796709 scopus 로고    scopus 로고
    • Non-intrusive design of concurrently self-testable FSMs
    • Guam, USA, 18-20 November
    • P. Drineas, Y. Makris: 'Non-Intrusive Design of Concurrently Self-Testable FSMs'. In: Proc. 11th Asian Test Symp. (ATS'02), Guam, USA, 18-20 November 2002, pp. 33-38
    • (2002) Proc. 11th Asian Test Symp. (ATS'02) , pp. 33-38
    • Drineas, P.1    Makris, Y.2
  • 13
    • 3042647420 scopus 로고    scopus 로고
    • Non-intrusive concurrent error detection in FSMs through state/output compaction and monitoring via parity trees
    • Messe Munich, Germany, 3-7 March
    • P. Drineas, Y. Makris: 'Non-Intrusive Concurrent Error Detection in FSMs through State/Output Compaction and Monitoring via Parity Trees'. In: Proc. Design, Automation and Test in Europe Conference and Exhibition (DATE '03), Messe Munich, Germany, 3-7 March 2003, pp. 1164-1165
    • (2003) Proc. Design, Automation and Test in Europe Conference and Exhibition (DATE '03) , pp. 1164-1165
    • Drineas, P.1    Makris, Y.2
  • 14
    • 0028014716 scopus 로고
    • Concurrent error-detection and modular fault tolerance in a 32-bit processing core for embedded space flight applications
    • Austin, Texas, 15-17 June
    • J. Gaisler: 'Concurrent Error-detection and Modular Fault Tolerance in a 32-bit Processing Core for Embedded Space Flight Applications'. In: Proc. 24th Annu. Int. Symp. Fault-Tolerant Computing, Austin, Texas, 15-17 June 1994, pp. 128-130
    • (1994) Proc. 24th Annu. Int. Symp. Fault-tolerant Computing , pp. 128-130
    • Gaisler, J.1
  • 15
    • 0034845496 scopus 로고    scopus 로고
    • NanoFabrics: Spatial computing using molecular electronics
    • 30 June-4 July , Goteborg, Sweden
    • S. Goldstein, M. Budiu: 'NanoFabrics: Spatial Computing Using Molecular Electronics'. In: Proc. 28th Int. Symp. Computer Architecture, ISCA, 2001, 30 June-4 July 2001, Goteborg, Sweden, pp. 178-191
    • (2001) Proc. 28th Int. Symp. Computer Architecture, ISCA, 2001 , pp. 178-191
    • Goldstein, S.1    Budiu, M.2
  • 21
    • 16244418637 scopus 로고    scopus 로고
    • Defect-tolerant logic with nanoscale crossbar circuits
    • submitted to
    • T. Hogg, G. Snider: Defect-tolerant logic with nanoscale crossbar circuits, submitted to IEEE Trans. Nanotechnol.
    • IEEE Trans. Nanotechnol.
    • Hogg, T.1    Snider, G.2
  • 25
    • 16244384948 scopus 로고    scopus 로고
    • Molecular wire crossbar memory, US Patent No. 6 128 214
    • P.J. Kuekes, R.S. Williams, J.R. Heath: Molecular wire crossbar memory, US Patent No. 6 128 214 (2000)
    • (2000)
    • Kuekes, P.J.1    Williams, R.S.2    Heath, J.R.3
  • 26
    • 16244395437 scopus 로고    scopus 로고
    • Demultiplexer for a molecular wire crossbar network, US Patent No. 6 256 767
    • P. Kuekes, R.S. Williams: Demultiplexer for a molecular wire crossbar network, US Patent No. 6 256 767 (2001)
    • (2001)
    • Kuekes, P.1    Williams, R.S.2
  • 27
    • 16244420042 scopus 로고    scopus 로고
    • Molecular-wire crossbar interconnect (MWCI) for signal routing and communications, US Patent No. 6 314 019
    • P.J. Kuekes, R.S. Williams, J.R. Heath: Molecular-wire crossbar interconnect (MWCI) for signal routing and communications, US Patent No. 6 314 019 (2001)
    • (2001)
    • Kuekes, P.J.1    Williams, R.S.2    Heath, J.R.3
  • 28
    • 16244416810 scopus 로고    scopus 로고
    • Molecular crossbar latch, US Patent No. 6 586 965
    • P. Kuekes: Molecular crossbar latch, US Patent No. 6 586 965 (2003)
    • (2003)
    • Kuekes, P.1
  • 29
    • 16244402609 scopus 로고    scopus 로고
    • Molecular wire transistor (MWT), US Patent No. 6 559 468
    • P.J. Kuekes, R.S. Williams: Molecular wire transistor (MWT), US Patent No. 6 559 468 (2003)
    • (2003)
    • Kuekes, P.J.1    Williams, R.S.2
  • 34
    • 0142184735 scopus 로고    scopus 로고
    • Defect tolerance at the end of the roadmap
    • 30 September-2 October , Charlotte, NC, USA
    • M. Mishra, S. Goldstein: 'Defect Tolerance at the End of the Roadmap'. In: Proc. Int. Test Conf. 2003 (ITC 2003), 30 September-2 October 2003, Vol. 1, Charlotte, NC, USA, pp. 1201-1210
    • (2003) Proc. Int. Test Conf. 2003 (ITC 2003) , vol.1 , pp. 1201-1210
    • Mishra, M.1    Goldstein, S.2
  • 35
    • 0034476298 scopus 로고    scopus 로고
    • Which concurrent error detection scheme to choose?
    • 3-5 October , Atlantic City, NJ, USA
    • S. Mitra, E. McCluskey: 'Which Concurrent Error Detection Scheme to Choose?'. In: Proc. Int. Test Conf. 2000, 3-5 October 2000, Atlantic City, NJ, USA, pp. 985-994
    • (2000) Proc. Int. Test Conf. 2000 , pp. 985-994
    • Mitra, S.1    McCluskey, E.2
  • 36
    • 0034994974 scopus 로고    scopus 로고
    • Design diversity for concurrent error detection in sequential logic circuits
    • 29 April-3 May , Marina Del Rey, CA, USA
    • S. Mitra, E. McCluskey: 'Design Diversity for Concurrent Error Detection in Sequential Logic Circuits'. In: Proc. 19th IEEE VLSI Test Symp. (VTS 2001), 29 April-3 May 2001, Marina Del Rey, CA, USA, pp. 178-183
    • (2001) Proc. 19th IEEE VLSI Test Symp. (VTS 2001) , pp. 178-183
    • Mitra, S.1    McCluskey, E.2
  • 37
    • 0032684765 scopus 로고    scopus 로고
    • Time redundancy based soft-error tolerance to rescue nanometer technologies
    • 25-29 April , San Diego, CA, USA
    • M. Nicolaidis: 'Time Redundancy Based Soft-error Tolerance to Rescue Nanometer Technologies'. In: Proc. 17th IEEE VLSI Test Symp., 25-29 April 1999, San Diego, CA, USA pp. 86-94
    • (1999) Proc. 17th IEEE VLSI Test Symp. , pp. 86-94
    • Nicolaidis, M.1
  • 38
    • 0001394083 scopus 로고    scopus 로고
    • P. Packen: Science 24, 2079 (1999)
    • (1999) Science , vol.24 , pp. 2079
    • Packen, P.1
  • 41
    • 16244411924 scopus 로고    scopus 로고
    • Limitations of design methods for self-checking synchronous sequential machines
    • Madison, Wisconsin, 15-18 June , Session 6C: Fast Abstracts I, Madison, WI, USA
    • S. Piestrak: 'Limitations of Design Methods for Self-Checking Synchronous Sequential Machines'. FastAbstract 29th Int. Symp. Fault-Tolerant Computing, Madison, Wisconsin, 15-18 June 1999, Session 6C: Fast Abstracts I, Madison, WI, USA
    • (1999) FastAbstract 29th Int. Symp. Fault-Tolerant Computing
    • Piestrak, S.1
  • 43
    • 16244412242 scopus 로고    scopus 로고
    • Single-event upset hardened reconfigurable bi-stable CMOS latch, US Patent No. 6 369 630
    • L. Rockett: Single-event upset hardened reconfigurable bi-stable CMOS latch, US Patent No. 6 369 630 (2002)
    • (2002)
    • Rockett, L.1
  • 44
    • 0032597692 scopus 로고    scopus 로고
    • AR-SMT: A microarchitectural approach to fault tolerance in microprocessors
    • 15-18 June , Madison, WI, USA
    • E. Rotenberg: 'AR-SMT: A Microarchitectural Approach to Fault Tolerance in Microprocessors'. In: Proc. 29th Fault-Tolerant Computing Symposium, 15-18 June 1999, Madison, WI, USA, pp. 84-91
    • (1999) Proc. 29th Fault-tolerant Computing Symposium , pp. 84-91
    • Rotenberg, E.1
  • 48
    • 15844416561 scopus 로고    scopus 로고
    • Crossbar demultiplexers for nanoelectronics based on N-hot codes
    • to appear in
    • G. Snider, W. Robinette: Crossbar demultiplexers for nanoelectronics based on N-hot codes, to appear in IEEE Trans. Nanotechnol.
    • IEEE Trans. Nanotechnol.
    • Snider, G.1    Robinette, W.2
  • 50
    • 16244365473 scopus 로고    scopus 로고
    • Configurable molecular switch array, US Patent Application Publication No. US 2004/0041617 A1, 4 March
    • G. Snider, P. Kuekes, R.S. Williams: Configurable molecular switch array, US Patent Application Publication No. US 2004/0041617 A1, 4 March 2004
    • Snider, G.1    Kuekes, P.2    Williams, R.S.3
  • 53
    • 0003133883 scopus 로고
    • Probabilistic logics and the synthesis of reliable organisms from unreliable components
    • Princeton University Press
    • J. von Neumann: 'Probabilistic Logics and the Synthesis of Reliable Organisms from Unreliable Components'. In: Automata Studies (Princeton University Press 1956) pp. 43-98
    • (1956) Automata Studies , pp. 43-98
    • Von Neumann, J.1
  • 57
    • 0033309292 scopus 로고    scopus 로고
    • Finite state machine synthesis with concurrent error detection
    • 27-30 September , Atlantic City, NJ, USA
    • C. Zeng, N. Saxena, E. McCluskey: 'Finite State Machine Synthesis with Concurrent Error Detection'. In: Proc. ITC Int. Test Conf., 27-30 September 1999, Atlantic City, NJ, USA, pp. 672-679
    • (1999) Proc. ITC Int. Test Conf. , pp. 672-679
    • Zeng, C.1    Saxena, N.2    McCluskey, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.