Defect Tolerance at the End of the Roadmap

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 1201-1210

  Mishra, Mahim ^a   Goldstein, Seth C ^a  

^a Carnegie Mellon University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MICROPROCESSOR CHIPS; NANOTECHNOLOGY; VECTORS;

DEFECT TOLERANCE;

INTEGRATED CIRCUIT TESTING;

EID: 0142184735     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (28)

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