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Volumn 4, Issue 6, 2005, Pages 681-687

Deterministic addressing of nanoscale devices assembled at sublithographic pitches

Author keywords

Defect tolerance; Electronic nanotechnology; Molecular electronics; Stochastic assembly

Indexed keywords

DEFECT TOLERANCE; ELECTRONIC NANOTECHNOLOGY; MOLECULAR ELECTRONICS; STOCHASTIC ASSEMBLY;

EID: 28444439630     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2005.858587     Document Type: Article
Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.