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Volumn 285, Issue 5426, 1999, Pages 391-394

Electronically configurable molecular-based logic gates

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRODES; MONOLAYERS; SEMICONDUCTOR SWITCHES;

EID: 0033575366     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.285.5426.391     Document Type: Article
Times cited : (1442)

References (22)
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    • A. J. G. Hey and R. W. Allen, Eds. Addison-Wesley, Menlo Park, CA
    • R. P. Feynman, Lectures in Computation, A. J. G. Hey and R. W. Allen, Eds. (Addison-Wesley, Menlo Park, CA, 1996).
    • (1996) Lectures in Computation
    • Feynman, R.P.1
  • 4
    • 0032679023 scopus 로고    scopus 로고
    • I. Amlani et al., Science 284, 289 (1999).
    • (1999) Science , vol.284 , pp. 289
    • Amlani, I.1
  • 8
    • 0345629603 scopus 로고    scopus 로고
    • We correlated the electrochemical properties of a dilute solution of these molecules with their electronic properties in these solid state devices. Thus, the device characteristics were determined by single-molecule properties. See the supplementary material available at www.sciencemag.org/feature/data/1039735.shl
  • 9
    • 0002336037 scopus 로고    scopus 로고
    • June
    • Here we refer to a field programmable gate array (FPGA). A discussion of FPGAs and their applications to configurable computing can be found in J. Villasenor and W. Mangione-Smith, Sci. Am. 276, 68 (June 1997).
    • (1997) Sci. Am. , vol.276 , pp. 68
    • Villasenor, J.1    Mangione-Smith, W.2
  • 10
    • 0345197552 scopus 로고    scopus 로고
    • U.S. Patent 5 640 343 (1997)
    • W. J. Gallagher et al., U.S. Patent 5 640 343 (1997).
    • Gallagher, W.J.1
  • 11
    • 27844512561 scopus 로고    scopus 로고
    • 2/molecule for R(2). Previous work on LB films of similar molecules has been reported [D. B. Amabilino et al., New J. Chem. 1998, 959 (1998)].
    • (1998) New J. Chem. , vol.1998 , pp. 959
    • Amabilino, D.B.1
  • 15
    • 0344335055 scopus 로고    scopus 로고
    • note
    • These devices were operated under ambient conditions and no effort was made to exclude water or oxygen vapor. Their performance degraded over a period of a few days, similar to what would be expected for an unpackaged polymer-based electronic device. At voltages near ± 3 V, the junction breaks down and an open circuit is measured. The overall device yield, based on measuring several hundred devices over ∼20 separate fabrication runs, was greater than 95%.
  • 16
    • 0344767087 scopus 로고    scopus 로고
    • note
    • We monitored the oxidation of the devices by holding the device at a positive (oxidizing) bias for extended periods, and then monitoring the current through the device at -2.0 V. Oxidation at +0.7 V took several minutes, but oxidation only took a few seconds at voltages above +1 V. When devices were oxidized at +0.5 V, the current flow at -2.0 V dropped only very slightly - by about 1% per minute of oxidation.
  • 21
    • 0344335054 scopus 로고    scopus 로고
    • note
    • By the term "crosstalk," we are referring to complications that might arise when separate devices share a common electrode. One complication might be the unintentional oxidation of a device.
  • 22
    • 0344767086 scopus 로고    scopus 로고
    • This work was supported by the Office of Naval Research (contract N00014-98-1-0422), the NSF-GOALI program, and Defense Advance Research Projects Agency
    • This work was supported by the Office of Naval Research (contract N00014-98-1-0422), the NSF-GOALI program, and Defense Advance Research Projects Agency.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.