Built-in self-test of molecular electronics-based nanofabrics

Proceedings of the 10th IEEE European Test Symposium, ETS 2005

Volumn 2005, Issue , 2005, Pages 168-173

  Wang, Zhanglei ^a   Chakrabarty, Krishnendu ^a  

^a Duke University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST;

DEFECT-FREE BLOCKS; MOLECULAR ELECTRONICS;

NANOTECHNOLOGY;

EID: 33744475654     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2005.10     Document Type: Conference Paper

References (9)

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