Seven strategies for tolerating highly defective fabrication

IEEE Design and Test of Computers

Volumn 22, Issue 4, 2005, Pages 306-315

  DeHon, André ^a   Naeimi, Helia ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ARRAYS; DEFECTS; LOGIC DEVICES; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SYNTHESIS (CHEMICAL);

MOLECULAR ELECTRONICS; NANOCROSSBARS; NANOWIRES; PROGRAMMABLE LOGIC ARRAYS;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 24344437274     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2005.94     Document Type: Article

References (12)

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