Reliability evaluation of von Neumann multiplexing based defect-tolerant majority circuits

2004 4th IEEE Conference on Nanotechnology

Volumn , Issue , 2004, Pages 599-601

  Bhaduri, Debayan ^a   Shukla, Sandeep K ^a  

^a State University   (United States)

Author keywords

Defect tolerance; Majority; Multiplexing; Nanotechnology; Probabilistic model checking; Reliability

Indexed keywords

DEFECT-TOLERANCE; LOGIC FUNCTIONS; MAJORITY; PROBABILISTIC MODEL CHECKING;

CALCULATIONS; LOGIC GATES; NANOTECHNOLOGY; NETWORKS (CIRCUITS); PROBABILITY; RELIABILITY;

MULTIPLEXING;

EID: 20344396142     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

1. I. Amlani, A. O. Orlov, G. Toth, G. H. Bernstein, C. S. Lent, and G. L. Snider, 'Digital logic gate using quantum-dot cellular automata'. Science 284 (1999), no. 289-291. Available at: http://www.nd.edu/qcahome-/reprints/Amlani2. pdf.
2. D. Bhaduri and S. Shukla, Nanoprism: A tool for evaluating granularity vs. reliability trade-off's in nano architectures, in GLSVLSI (ACM, Boston, MA, April 2004). http://fermat.ece.vt.edu/Publications/pubs/techrep/techrep0318.pdf.
3. J. Han and P. Jonker, 'A system architecture solution for unreliable nanoelectronic devices', IEEE Transactions on Nanotechnology 1 (2002), 201-208.
4. C. Lent, 'A device architecture for computing with quantum dots', in Porceedings of the IEEE (April 1997), 85.
5. K. Nikolic, A. Sadek, and M. Forshaw. 'Architectures for reliable computing with unreliable nanodevices', in Proc. IEEE-NANO'01 (IEEE, 2001). 254-259.
6. G. Norman, D. Parker, M. Kwiatkowska, and S. Shukla, 'Evaluating reliability of defect tolerant architecture for nanotechnology using probabilistic model checking', in Proc. IEEE VLSI Design Conference (IEEE Press, 2004), to appear.
7. Web Page: www.cs.bham.ac.uk/dxp/prism/.
8. S. Roy, V. Beiu, and M. Sulieman, Majority multiplexing: Economical redundant fault-tolerant designs for nano architectures.
9. S. Roy, V. Beiu, and M. Sulieman, Reliability analysis of some nano architectures.
10. R. Turton, The quantum dot: A journey into the future of microelectronics (Oxford University Press, U.K, 1995).
11. J. von Neumann, 'Probabilistic logics and synthesis of reliable organisms from unreliable components', Automata Studies (1956), 43-98.