CAEN-BIST: Testing the nanofabric

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 462-471

  Brown, Jason G ^a   Blanton, R D ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILD-IN REDUNDANCY; CHEMICALLY-ASSEMBLED ELECTRONIC NANOTECHNOLOGY (CAEN); FAULT DIAGNOSIS; LOGIC BLOCKS;

ALGORITHMS; CMOS INTEGRATED CIRCUITS; FIELD PROGRAMMABLE GATE ARRAYS; MICROPROCESSOR CHIPS; NANOTECHNOLOGY; RANDOM ACCESS STORAGE; SELF ASSEMBLY;

BUILT-IN SELF TEST;

EID: 18144425202     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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