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Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 23, 2007, Pages

Nanometer-scale control of single quantum dot nucleation through focused ion-beam implantation

(4) Portavoce, A a,c Hull, R a Reuter, M C b Ross, F M b

a University of Virginia ^* (United States)

b IBM T J WATSON RESEARCH CENTER (United States)

c AIX MARSEILLE UNIVERSITÉ (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36849036276 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.76.235301 Document Type: Article

Times cited : (38)

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