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Volumn 53, Issue 24, 1996, Pages 16334-16337

Stress-induced self-organization of nanoscale structures in SiGe/Si multilayer films

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Indexed keywords


EID: 2842567225     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.16334     Document Type: Article
Times cited : (235)

References (19)
  • 10
    • 0005327458 scopus 로고
    • H.-N. Yang, G.-C. Wang, and T.-M. Lu, Diffraction from Rough Surfaces and Dynamic Growth Fronts (World Scientific, Singapore, 1993), p. 64;
    • See, e.g., J. M. Elson, H. E. Bennett and J. M. Bennett, Appl. Opt. Opt. Eng. 69, 191 (1979); H.-N. Yang, G.-C. Wang, and T.-M. Lu, Diffraction from Rough Surfaces and Dynamic Growth Fronts (World Scientific, Singapore, 1993), p. 64;
    • (1979) Appl. Opt. Opt. Eng. , vol.69 , pp. 191
    • Elson, J.1    Bennett, H.2    Bennett, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.