Direct evaluation of composition profile, strain relaxation, and elastic energy of Ge:Si(001) self-assembled islands by anomalous x-ray scattering

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 24, 2002, Pages 2453121-2453126

  Magalhaes Paniago R ^a   Medeiros Ribeiro, G ^a,b   Malachias, A ^c   Kycia, S ^a   Kamins, T I ^b   Williams, R Stan ^b  

^a LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

^b HEWLETT PACKARD LABORATORIES   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CRYSTALLIZATION; DIFFUSION; ELASTICITY; ENERGY; KINETICS; MEASUREMENT; MORPHOLOGY; NANOTECHNOLOGY; RADIATION SCATTERING; THERMODYNAMICS;

EID: 0037116130     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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