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Volumn 70, Issue 4, 1997, Pages 493-495
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Atomic force microscopy study of self-organized Ge islands grown on Si(100) by low pressure chemical vapor deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000625970
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.118191 Document Type: Article |
Times cited : (78)
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References (18)
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