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Volumn 84, Issue 25, 2004, Pages 5213-5215
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Focused-ion-beam directed self-assembly of Cu 2O islands on SrTiO 3(100)
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Author keywords
[No Author keywords available]
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Indexed keywords
FOCUSED ION BEAMS (FIB);
ION DENSITY;
NANOPATTERINING;
OXYGEN PLASMA ASSISTED MOLECULAR BEAM EPITAXY (OPA-MBE);
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
CRYSTAL ORIENTATION;
ION BEAMS;
MOLECULAR BEAM EPITAXY;
PLASMA APPLICATIONS;
SELF ASSEMBLY;
SINGLE CRYSTALS;
STRONTIUM COMPOUNDS;
SURFACE TOPOGRAPHY;
SYNTHESIS (CHEMICAL);
X RAY PHOTOELECTRON SPECTROSCOPY;
COPPER OXIDES;
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EID: 3142689640
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1765212 Document Type: Article |
Times cited : (27)
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References (15)
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