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Volumn 82, Issue 7, 2003, Pages 1093-1095

Lateral control of self-assembled island nucleation by focused-ion-beam micropatterning

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; NUCLEATION; SELF ASSEMBLY; SPUTTERING; SURFACE ACTIVE AGENTS;

EID: 0037450220     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1542680     Document Type: Article
Times cited : (85)

References (22)
  • 6
    • 0012405683 scopus 로고    scopus 로고
    • 16875 OR
    • FEI Beam Technology, OR, User's Guide PN 16875, (2001).
    • (2001) User's Guide PN
  • 9
    • 0012443646 scopus 로고    scopus 로고
    • Low frequency acoustic noise, coupling into the system and causing vibration of the FIB with respect to the sample surface, would elongate spots written with short times in one direction, while high frequency noise would give a spot size independent of irradiation time.
    • Low frequency acoustic noise, coupling into the system and causing vibration of the FIB with respect to the sample surface, would elongate spots written with short times in one direction, while high frequency noise would give a spot size independent of irradiation time.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.