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Volumn 48, Issue 1, 2012, Pages 289-327

Measuring atomic-scale variations of the electrostatic force

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Indexed keywords


EID: 84870655844     PISSN: 09315195     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-3-642-22566-6_13     Document Type: Article
Times cited : (3)

References (103)
  • 3
    • 0242413017 scopus 로고    scopus 로고
    • Polycrystalline Semiconductors VII, Proceedings, Solid State Phenomena
    • ed. by T. Fuyuki, T. Sameshima, H. Strunk, J. Werner, vol. 93, 7th International Conference on Polycrystalline Semiconductors, Nara, Japan, Sep 10-13, 2002
    • S. Sadewasser, K. Ishii, T. Glatzel, M. Lux-Steiner, in Polycrystalline Semiconductors VII, Proceedings, Solid State Phenomena, vol. 93, ed. by T. Fuyuki, T. Sameshima, H. Strunk, J. Werner (2003), Solid State Phenomena, vol. 93, pp. 319-324. 7th International Conference on Polycrystalline Semiconductors, Nara, Japan, Sep 10-13, 2002
    • (2002) Solid State Phenomena
    • Sadewasser, S.1    Ishii, K.2    Glatzel, T.3    Lux-Steiner, M.4
  • 26
    • 0031550437 scopus 로고    scopus 로고
    • Proceedings of the International Vacuum Electron Sources Conference 1996
    • K. Wandelt, Appl. Surf. Sci. 111, 1 (1997). Proceedings of the International Vacuum Electron Sources Conference 1996
    • (1997) Appl. Surf. Sci , vol.111 , Issue.1
    • Wandelt, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.