Double quartz tuning fork sensor for low temperature atomic force and scanning tunneling microscopy

Review of Scientific Instruments

Volumn 75, Issue 7, 2004, Pages 2446-2450

  Heyde, M ^a   Kulawik, M ^a   Rust, H P ^a   Freund, H J ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; AMPLIFIERS (ELECTRONIC); ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; ELECTRIC POTENTIAL; FREQUENCY MODULATION; MESFET DEVICES; NATURAL FREQUENCIES; OSCILLATIONS; QUARTZ; SCANNING TUNNELING MICROSCOPY; SIGNAL TO NOISE RATIO; STIFFNESS; ULTRAHIGH VACUUM; VIBRATIONS (MECHANICAL);

DOUBLE QUARTZ TUNING FORK SENORS; EIGENMODES; FORCE SENSORS; SURFACE RECONSTRUCTION;

SENSORS;

EID: 4043106281     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1765753     Document Type: Article

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