Evaluation of Kelvin probe force microscopy for imaging grain boundaries in chalcopyrite thin films

Applied Physics Letters

Volumn 89, Issue 11, 2006, Pages

  Leendertz, C ^a   Streicher, F ^a   Lux Steiner, M Ch ^a   Sadewasser, S ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELDS; FINITE ELEMENT METHOD; GRAIN BOUNDARIES; IMAGING TECHNIQUES; SOLAR CELLS;

CHALCOPYRITE; KELVIN PROBE FORCE MICROSCOPY (KPFM); THIN FILM SOLAR CELLS;

THIN FILMS;

EID: 33748759000     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2354474     Document Type: Article

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