Atomic structure of InSb(001) and GaAs(001) surfaces imaged with noncontact atomic force microscopy

Physical Review Letters

Volumn 90, Issue 22, 2003, Pages 2261011-2261014

  Kolodziej, J J ^a   Such, B ^a   Szymonski, M ^a   Krok, F ^a  

^a JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; INDIUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

SPUTTER CLEANING;

CRYSTAL ATOMIC STRUCTURE;

EID: 0038792197     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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