Kelvin probe force microscopy of semiconductor surface defects

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 8, 2004, Pages

  Rosenwaks, Y ^a   Shikler, R ^a   Glatzel, Th ^b   Sadewasser, S ^b  

^a TEL AVIV UNIVERSITY   (Israel)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALCULATION; DENSITY; DIELECTRIC CONSTANT; ELECTRIC POTENTIAL; ELECTRICITY; ENERGY; IMAGE QUALITY; IMAGE RECONSTRUCTION; KELVIN PROBE FORCE MICROSCOPY; MATHEMATICAL ANALYSIS; MEASUREMENT; MICROSCOPY; SEMICONDUCTOR; VACUUM;

EID: 19544376453     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.085320     Document Type: Article

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