Determination of the local contact potential difference of PTCDA on NaCl: Acomparison of techniques

Nanotechnology

Volumn 20, Issue 26, 2009, Pages

  Burke, S A ^a   Ledue, J M ^a   Miyahara, Y ^a   Topple, J M ^a   Fostner, S ^a   Grutter P ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS MODULATION; CONTACT POTENTIAL DIFFERENCE; DC BIAS; FREQUENCY SHIFT; IMAGING RESOLUTIONS; INSULATING SUBSTRATES; KELVIN PROBE FORCE MICROSCOPY; LOCAL ELECTRONIC STRUCTURES; ORGANIC DEPOSITS; ORGANIC SEMICONDUCTOR; PERYLENE TETRACARBOXYLIC; TEST SYSTEMS;

AMPLITUDE MODULATION; ELECTRONIC STRUCTURE; FREQUENCY MODULATION; SODIUM CHLORIDE; SPECTROSCOPIC ANALYSIS;

SEMICONDUCTING ORGANIC COMPOUNDS;

PERYLENE; SODIUM CHLORIDE; 3,4,9,10 PERYLENETETRACARBOXYLIC DIANHYDRIDE; 3,4,9,10-PERYLENETETRACARBOXYLIC DIANHYDRIDE; ACID ANHYDRIDE; DRUG DERIVATIVE;

ACCURACY; AMPLITUDE MODULATION; ARTICLE; FREQUENCY MODULATION; IMAGE ANALYSIS; INTERMETHOD COMPARISON; MOLECULAR IMAGING; MOLECULAR INTERACTION; OPTICAL RESOLUTION; POTENTIAL DIFFERENCE; PRIORITY JOURNAL; SEMICONDUCTOR; SPECTROSCOPY; ALGORITHM; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRICITY; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY;

ALGORITHMS; ANHYDRIDES; ELECTRICITY; EQUIPMENT DESIGN; MICROSCOPY, ATOMIC FORCE; PERYLENE; SODIUM CHLORIDE; SPECTRUM ANALYSIS;

EID: 67649386606     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/26/264012     Document Type: Article

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