Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2 (110) surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 4, 2008, Pages

  Enevoldsen, Georg H ^a   Pinto, Henry P ^b   Foster, Adam S ^b   Jensen, Mona C R ^a   Kühnle, Angelika ^c   Reichling, Michael ^c   Hofer, Werner A ^d   Lauritsen, Jeppe V ^a   Besenbacher, Flemming ^a  

^a AARHUS UNIVERSITY   (Denmark)

^b AALTO UNIVERSITY   (Finland)

^c UNIVERSITY OF OSNABRÜCK   (Germany)

^d UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 47949115492     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.045416     Document Type: Article

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