Label-free and high-resolution protein/DNA nanoarray analysis using Kelvin probe force microscopy

Nature Nanotechnology

Volumn 2, Issue 10, 2007, Pages 653-659

  Sinensky, Asher K ^a   Belcher, Angela M ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; SURFACE POTENTIAL;

BIOLOGICAL MOLECULE; CHARGE CENTRES; HIGH RESOLUTION; KELVIN PROBE FORCE MICROSCOPES; KELVIN PROBE FORCE MICROSCOPY; LOCAL VARIATIONS; NEGATIVELY CHARGED; SCANNING PROBE TECHNIQUES;

BIOMOLECULES;

NUCLEOTIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; DNA DETERMINATION; KELVIN PROBE FORCE MICROSCOPY; MICROSCOPE; MICROSCOPY; NANOARRAY; NANOPROBE; PRIORITY JOURNAL; PROTEIN ANALYSIS;

EID: 34948833721     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2007.293     Document Type: Article

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