The surface potential of the Si nanostructure on a Si (1 1 1) 7 × 7 surface generated by contact of a cantilever tip

Applied Surface Science

Volumn 202, Issue 3-4, 2002, Pages 218-222

  Shiota, T ^a   Nakayama, K ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Contact; Nanostructure; ncAFM; Si (1 1 1); SKPM; Surface potential

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; QUENCHING; SEMICONDUCTING SILICON; ULTRAHIGH VACUUM;

SCANNING KELVIN PROBE MICROSCOPY (SKPM);

SURFACE TREATMENT;

EID: 0037203057     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00926-1     Document Type: Article

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