Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

Nanotechnology

Volumn 19, Issue 14, 2008, Pages

  Glatzel, Th ^a   Rusu, M ^b   Sadewasser, S ^b   Lux Steiner, M Ch ^b  

^a UNIVERSITY OF BASEL   (Switzerland)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

KELVIN PROBE FORCE MICROSCOPY; SURFACE PHOTOVOLTAGE ANALYSIS;

CADMIUM COMPOUNDS; MICROSCOPIC EXAMINATION; PHOTOVOLTAIC EFFECTS; THIN FILMS; ULTRAHIGH VACUUM;

POLYCRYSTALLINE MATERIALS;

COPPER DERIVATIVE; POLYCRYSTALLINE CHALCOPYRITE; PYRITE; UNCLASSIFIED DRUG;

ANALYTIC METHOD; ARTICLE; FILM; KELVIN PROBE FORCE MICROSCOPY; MICROSCOPY; PRIORITY JOURNAL; SURFACE PHOTOVOLTAGE ANALYSIS; VACUUM;

EID: 41049115972     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/14/145705     Document Type: Article

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