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Physical Review Letters

Volumn 103, Issue 22, 2009, Pages

Systematic achievement of improved atomic-Scale contrast via bimodal dynamic force microscopy

(6) Kawai, Shigeki a Glatzel, Thilo a Koch, Sascha a Such, Bartosz a Baratoff, Alexis a Meyer, Ernst a

a UNIVERSITY OF BASEL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; BIMODAL DYNAMICS; FUNDAMENTAL RESONANCE FREQUENCY; JUMP-TO-CONTACT; LARGE AMPLITUDE OSCILLATION; NON-CONTACT DYNAMICS; PERFORMANCE IMPROVEMENTS; SHORT RANGE INTERACTIONS; SILICON CANTILEVER;

RESONANCE;

EID: 72649102477 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.103.220801 Document Type: Article

Times cited : (115)

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