Microscopic identification of the compensation mechanisms in Si-doped GaAs

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 15, 1996, Pages 10288-10291

  Domke, C ^a   Ebert, Ph ^a   Heinrich, M ^a   Urban, K ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000847586     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.10288     Document Type: Article

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