Scaling of analog-to-digital converters into ultra-deep-submicron CMOS

Proceedings of the Custom Integrated Circuits Conference

Volumn 2005, Issue , 2005, Pages 375-382

  Chiu, Y ^a   Nikolic B ^b   Gray, P R ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; EFFICIENCY; TRANSISTORS; VOLTAGE CONTROL;

DIGITAL CALIBRATION; NYQUIST CONVERTERS; SUPPLY VOLTAGES;

ANALOG TO DIGITAL CONVERSION;

EID: 33847133060     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2005.1568684     Document Type: Conference Paper

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