A continuously calibrated 12-b, 10-MS/s, 3.3-V A/D converter

IEEE Journal of Solid-State Circuits

Volumn 33, Issue 12, 1998, Pages 1920-1930

  Ingino, Joseph M ^a,b   Wooley, Bruce A ^a,b  

^a IEEE   (United States)

^b Stanford University   (United States)

Author keywords

Analog digital conversion; Calibration; Mixed analog digital integrated circuits; Sampled data circuits; Switchrd capacitor circuits

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CALIBRATION; CAPACITORS; CMOS INTEGRATED CIRCUITS; DIGITAL SIGNAL PROCESSING; SIGNAL TO NOISE RATIO;

ANALOG TO DIGITAL CONVERTER; SAMPLED DATA CIRCUIT;

ELECTRIC CONVERTERS;

EID: 0032316909     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.735532     Document Type: Article

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