A 1.8-V 1.6-G sample/s 8-b self-calibrating folding ADC with 7.26 ENOB at nyquist frequency

IEEE Journal of Solid-State Circuits

Volumn 39, Issue 12, 2004, Pages 2107-2115

  Taft, Robert C ^a   Menkus, Chris A ^a   Tursi, Maria Rosaria ^a   Hidri, Ols ^a   Pons, Valerie ^a  

^a National Semiconductor GmbH   (Germany)

Author keywords

Analog to digital conversion; Calibration; CMOS analog integrated circuits; Folding; High speed techniques; Interpolation; Nyquist converter

Indexed keywords

AMPLIFIERS (ELECTRONIC); APPROXIMATION THEORY; CALIBRATION; CMOS INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; INTERPOLATION; OPTIMIZATION;

CMOS ANALOG INTEGRATED CIRCUITS; FOLDING; HIGH-SPEED TECHNIQUES; NYQUIST CONVERTER;

ANALOG TO DIGITAL CONVERSION;

EID: 10444248089     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2004.836242     Document Type: Conference Paper

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