Soft lithography

Angewandte Chemie - International Edition

Volumn 37, Issue 5, 1998, Pages 550-575

  Xia, Younan ^a   Whitesides, George M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

Elastomers; Materials science; Patterning; Supramolecular chemistry

Indexed keywords

EID: 0031947320     PISSN: 14337851     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1521-3773(19980316)37:5<550::aid-anie550>3.3.co;2-7     Document Type: Review

References (379)

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8. General reviews on QSE: a) M. Sundaram, S. A. Chalmers, P. F. Hopkins, A. C. Gossard, Science 1991, 254, 1326-1335; b) M. A. Kastner, Phys. Today 1993, 46(1), 24-31; c) M. A. Reed, Sci. Am. 1993, 270(1), 118-123; d) H. Weller, Angew. Chem. 1993, 105, 43-56; Angew. Chem. Int. Ed. Engl. 1993, 32, 41-53.
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10. General reviews on QSE: a) M. Sundaram, S. A. Chalmers, P. F. Hopkins, A. C. Gossard, Science 1991, 254, 1326-1335; b) M. A. Kastner, Phys. Today 1993, 46(1), 24-31; c) M. A. Reed, Sci. Am. 1993, 270(1), 118-123; d) H. Weller, Angew. Chem. 1993, 105, 43-56; Angew. Chem. Int. Ed. Engl. 1993, 32, 41-53.
11. General reviews on QSE: a) M. Sundaram, S. A. Chalmers, P. F. Hopkins, A. C. Gossard, Science 1991, 254, 1326-1335; b) M. A. Kastner, Phys. Today 1993, 46(1), 24-31; c) M. A. Reed, Sci. Am. 1993, 270(1), 118-123; d) H. Weller, Angew. Chem. 1993, 105, 43-56; Angew. Chem. Int. Ed. Engl. 1993, 32, 41-53.
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14. General reviews on SET: a) K. K. Likharev, IBM J. Res. Dev. 1988, 32, 144-158; b) M. H. Devoret, D. Esteve, C. Urbina, Nature 1992, 360, 547-553; c) K. K. Likharev, T. Claeson, Sci. Am. 1992, 269(6), 80-85.
15. General reviews on SET: a) K. K. Likharev, IBM J. Res. Dev. 1988, 32, 144-158; b) M. H. Devoret, D. Esteve, C. Urbina, Nature 1992, 360, 547-553; c) K. K. Likharev, T. Claeson, Sci. Am. 1992, 269(6), 80-85.
16. General reviews on microelectromechanical systems (MEMS): a) K. D. Wise, K. Najafi, Science 1991, 254, 1335-1342; b) J. Bryzek, K. Peterson, W. McCulley, IEEE Spectrum 1994, 31(5), 20-31; c) N. C. MacDonald, Microelectron. Eng. 1996, 32, 49-73; d) G. T. A. Kovacs, K. Petersen, M. Albin, Anal. Chem. 1996, 68, 407A-412A.
17. General reviews on microelectromechanical systems (MEMS): a) K. D. Wise, K. Najafi, Science 1991, 254, 1335-1342; b) J. Bryzek, K. Peterson, W. McCulley, IEEE Spectrum 1994, 31(5), 20-31; c) N. C. MacDonald, Microelectron. Eng. 1996, 32, 49-73; d) G. T. A. Kovacs, K. Petersen, M. Albin, Anal. Chem. 1996, 68, 407A-412A.
18. General reviews on microelectromechanical systems (MEMS): a) K. D. Wise, K. Najafi, Science 1991, 254, 1335-1342; b) J. Bryzek, K. Peterson, W. McCulley, IEEE Spectrum 1994, 31(5), 20-31; c) N. C. MacDonald, Microelectron. Eng. 1996, 32, 49-73; d) G. T. A. Kovacs, K. Petersen, M. Albin, Anal. Chem. 1996, 68, 407A-412A.
19. General reviews on microelectromechanical systems (MEMS): a) K. D. Wise, K. Najafi, Science 1991, 254, 1335-1342; b) J. Bryzek, K. Peterson, W. McCulley, IEEE Spectrum 1994, 31(5), 20-31; c) N. C. MacDonald, Microelectron. Eng. 1996, 32, 49-73; d) G. T. A. Kovacs, K. Petersen, M. Albin, Anal. Chem. 1996, 68, 407A-412A.
20. General reviews and highlights on microanalytical systems: a) R. E. Service, Science 1995, 268, 26-27; b) A. Manz, Chimia 1996, 59, 140-145; c) D. Craston, S. Cowen, Chem. Br. 1996(10), 31-33; d) P. Day, ibid. 1996(7), 29-31; e) A. Goffeau, Nature 1997, 385, 202-203.
21. General reviews and highlights on microanalytical systems: a) R. E. Service, Science 1995, 268, 26-27; b) A. Manz, Chimia 1996, 59, 140-145; c) D. Craston, S. Cowen, Chem. Br. 1996(10), 31-33; d) P. Day, ibid. 1996(7), 29-31; e) A. Goffeau, Nature 1997, 385, 202-203.
22. General reviews and highlights on microanalytical systems: a) R. E. Service, Science 1995, 268, 26-27; b) A. Manz, Chimia 1996, 59, 140-145; c) D. Craston, S. Cowen, Chem. Br. 1996(10), 31-33; d) P. Day, ibid. 1996(7), 29-31; e) A. Goffeau, Nature 1997, 385, 202-203.
23. General reviews and highlights on microanalytical systems: a) R. E. Service, Science 1995, 268, 26-27; b) A. Manz, Chimia 1996, 59, 140-145; c) D. Craston, S. Cowen, Chem. Br. 1996(10), 31-33; d) P. Day, ibid. 1996(7), 29-31; e) A. Goffeau, Nature 1997, 385, 202-203.
24. General reviews and highlights on microanalytical systems: a) R. E. Service, Science 1995, 268, 26-27; b) A. Manz, Chimia 1996, 59, 140-145; c) D. Craston, S. Cowen, Chem. Br. 1996(10), 31-33; d) P. Day, ibid. 1996(7), 29-31; e) A. Goffeau, Nature 1997, 385, 202-203.
25. Recent reports on microoptics: a) Y. A. Carts, Laser Focus World 1994, 30, 67-71; b) S. S. Lee, L. Y. Lin, M. C. Wu, Appl. Phys. Lett. 1995, 67, 2135-2137; c) M. C. Wu, L. Y. Lin, S. S. Lee, C. R. King, Laser Focus World 1996, 32, 64-68.
26. Recent reports on microoptics: a) Y. A. Carts, Laser Focus World 1994, 30, 67-71; b) S. S. Lee, L. Y. Lin, M. C. Wu, Appl. Phys. Lett. 1995, 67, 2135-2137; c) M. C. Wu, L. Y. Lin, S. S. Lee, C. R. King, Laser Focus World 1996, 32, 64-68.
27. Recent reports on microoptics: a) Y. A. Carts, Laser Focus World 1994, 30, 67-71; b) S. S. Lee, L. Y. Lin, M. C. Wu, Appl. Phys. Lett. 1995, 67, 2135-2137; c) M. C. Wu, L. Y. Lin, S. S. Lee, C. R. King, Laser Focus World 1996, 32, 64-68.
28. General reviews on microsensors: a) H.-J. Galla, Angew. Chem. 1992, 104, 47-50; Angew. Chem. Int. Ed. Engl. 1992, 31, 45-47; b) P. Kleinschmidt, W. Hanrieder, Sens. Actuators A 1992, 33, 5-17; c) M. J. Vellekoop, G. W. Lubking, P. M. Sarro, A. Venema, ibid. 1994, 44, 249-263; d) G. Fuhr, T. Müller, T. Schnelle, R. Hagedorn, A. Voigt, S. Fiedler, W. A. Arnold, U. Zimmermann, B. Wagner, A. Heuberger, Naturwissenschaften 1994, 81, 528-535; e) J. Bryzek, Sensors 1996, 7, 4-38.
29. General reviews on microsensors: a) H.-J. Galla, Angew. Chem. 1992, 104, 47-50; Angew. Chem. Int. Ed. Engl. 1992, 31, 45-47; b) P. Kleinschmidt, W. Hanrieder, Sens. Actuators A 1992, 33, 5-17; c) M. J. Vellekoop, G. W. Lubking, P. M. Sarro, A. Venema, ibid. 1994, 44, 249-263; d) G. Fuhr, T. Müller, T. Schnelle, R. Hagedorn, A. Voigt, S. Fiedler, W. A. Arnold, U. Zimmermann, B. Wagner, A. Heuberger, Naturwissenschaften 1994, 81, 528-535; e) J. Bryzek, Sensors 1996, 7, 4-38.
30. General reviews on microsensors: a) H.-J. Galla, Angew. Chem. 1992, 104, 47-50; Angew. Chem. Int. Ed. Engl. 1992, 31, 45-47; b) P. Kleinschmidt, W. Hanrieder, Sens. Actuators A 1992, 33, 5-17; c) M. J. Vellekoop, G. W. Lubking, P. M. Sarro, A. Venema, ibid. 1994, 44, 249-263; d) G. Fuhr, T. Müller, T. Schnelle, R. Hagedorn, A. Voigt, S. Fiedler, W. A. Arnold, U. Zimmermann, B. Wagner, A. Heuberger, Naturwissenschaften 1994, 81, 528-535; e) J. Bryzek, Sensors 1996, 7, 4-38.
31. General reviews on microsensors: a) H.-J. Galla, Angew. Chem. 1992, 104, 47-50; Angew. Chem. Int. Ed. Engl. 1992, 31, 45-47; b) P. Kleinschmidt, W. Hanrieder, Sens. Actuators A 1992, 33, 5-17; c) M. J. Vellekoop, G. W. Lubking, P. M. Sarro, A. Venema, ibid. 1994, 44, 249-263; d) G. Fuhr, T. Müller, T. Schnelle, R. Hagedorn, A. Voigt, S. Fiedler, W. A. Arnold, U. Zimmermann, B. Wagner, A. Heuberger, Naturwissenschaften 1994, 81, 528-535; e) J. Bryzek, Sensors 1996, 7, 4-38.
32. General reviews on microsensors: a) H.-J. Galla, Angew. Chem. 1992, 104, 47-50; Angew. Chem. Int. Ed. Engl. 1992, 31, 45-47; b) P. Kleinschmidt, W. Hanrieder, Sens. Actuators A 1992, 33, 5-17; c) M. J. Vellekoop, G. W. Lubking, P. M. Sarro, A. Venema, ibid. 1994, 44, 249-263; d) G. Fuhr, T. Müller, T. Schnelle, R. Hagedorn, A. Voigt, S. Fiedler, W. A. Arnold, U. Zimmermann, B. Wagner, A. Heuberger, Naturwissenschaften 1994, 81, 528-535; e) J. Bryzek, Sensors 1996, 7, 4-38.
33. General reviews on microsensors: a) H.-J. Galla, Angew. Chem. 1992, 104, 47-50; Angew. Chem. Int. Ed. Engl. 1992, 31, 45-47; b) P. Kleinschmidt, W. Hanrieder, Sens. Actuators A 1992, 33, 5-17; c) M. J. Vellekoop, G. W. Lubking, P. M. Sarro, A. Venema, ibid. 1994, 44, 249-263; d) G. Fuhr, T. Müller, T. Schnelle, R. Hagedorn, A. Voigt, S. Fiedler, W. A. Arnold, U. Zimmermann, B. Wagner, A. Heuberger, Naturwissenschaften 1994, 81, 528-535; e) J. Bryzek, Sensors 1996, 7, 4-38.
34. Recent reviews on combinatorial synthesis: Chem. Rev. 1997, 97, 347-509.
35. General reviews on photolithography: a) S. Okazaki, J. Vac. Sci. Technol. B 1991, 9, 2829-2833; b) H. J. Jeong, D. A. Markle, G. Owen, F. Pease, A. Grenville, R. von Bünau, Solid State Technol. 1994, 37, 39-47; c) M. D. Levenson, ibid. 1995, 38, 57-66; d) L. Geppert, IEEE Spectrum 1996, 33(4), 33-38.
36. General reviews on photolithography: a) S. Okazaki, J. Vac. Sci. Technol. B 1991, 9, 2829-2833; b) H. J. Jeong, D. A. Markle, G. Owen, F. Pease, A. Grenville, R. von Bünau, Solid State Technol. 1994, 37, 39-47; c) M. D. Levenson, ibid. 1995, 38, 57-66; d) L. Geppert, IEEE Spectrum 1996, 33(4), 33-38.
37. General reviews on photolithography: a) S. Okazaki, J. Vac. Sci. Technol. B 1991, 9, 2829-2833; b) H. J. Jeong, D. A. Markle, G. Owen, F. Pease, A. Grenville, R. von Bünau, Solid State Technol. 1994, 37, 39-47; c) M. D. Levenson, ibid. 1995, 38, 57-66; d) L. Geppert, IEEE Spectrum 1996, 33(4), 33-38.
38. General reviews on photolithography: a) S. Okazaki, J. Vac. Sci. Technol. B 1991, 9, 2829-2833; b) H. J. Jeong, D. A. Markle, G. Owen, F. Pease, A. Grenville, R. von Bünau, Solid State Technol. 1994, 37, 39-47; c) M. D. Levenson, ibid. 1995, 38, 57-66; d) L. Geppert, IEEE Spectrum 1996, 33(4), 33-38.
39. General reviews on microlithographic techniques: a) W. M. Moreau, Semiconductor Lithography: Principles and Materials, Plenum, New York, 1988; b) D. Brambley, B. Martin, P. D. Prewett, Adv. Mater. Opt. Electron. 1994, 4, 55-74; c) Handbook of Microlithography, Micromachining, and Microfabrication, Vol. 1 (Ed.: P. Rai-Choudhury), SPIE Optical Engineering Press, Bellingham, WA, 1997.
40. General reviews on microlithographic techniques: a) W. M. Moreau, Semiconductor Lithography: Principles and Materials, Plenum, New York, 1988; b) D. Brambley, B. Martin, P. D. Prewett, Adv. Mater. Opt. Electron. 1994, 4, 55-74; c) Handbook of Microlithography, Micromachining, and Microfabrication, Vol. 1 (Ed.: P. Rai-Choudhury), SPIE Optical Engineering Press, Bellingham, WA, 1997.
41. General reviews on microlithographic techniques: a) W. M. Moreau, Semiconductor Lithography: Principles and Materials, Plenum, New York, 1988; b) D. Brambley, B. Martin, P. D. Prewett, Adv. Mater. Opt. Electron. 1994, 4, 55-74; c) Handbook of Microlithography, Micromachining, and Microfabrication, Vol. 1 (Ed.: P. Rai-Choudhury), SPIE Optical Engineering Press, Bellingham, WA, 1997.
42. General reviews on nanolithography: a) R. F. W. Pease, J. Vac. Sci. Technol. B 1992, 10, 278-285; b) F. Cerrina, C. Marrian, MRS Bull. 1996, 31(12), 56-62; c) Microelectron. Eng. 1996, 32, 1-418.
43. General reviews on nanolithography: a) R. F. W. Pease, J. Vac. Sci. Technol. B 1992, 10, 278-285; b) F. Cerrina, C. Marrian, MRS Bull. 1996, 31(12), 56-62; c) Microelectron. Eng. 1996, 32, 1-418.
44. General reviews on nanolithography: a) R. F. W. Pease, J. Vac. Sci. Technol. B 1992, 10, 278-285; b) F. Cerrina, C. Marrian, MRS Bull. 1996, 31(12), 56-62; c) Microelectron. Eng. 1996, 32, 1-418.
45. See, for example, a) W. D. Deninger, C. E. Garner, J. Vac. Sci. Technol. B 1988, 6, 337-340; b) R. G. Vadimsky, ibid. 1988, 6, 2221-2223.
46. See, for example, a) W. D. Deninger, C. E. Garner, J. Vac. Sci. Technol. B 1988, 6, 337-340; b) R. G. Vadimsky, ibid. 1988, 6, 2221-2223.
47. General reviews on photoresists: a) E. Reichmanis, L. F. Thompson, Chem. Rev. 1989, 89, 1273-1289; b) R. D. Miller, G. M. Wallraff, Adv. Mater. Opt. Electron. 1994, 4, 95-127; c) A. Reiser, H.-Y. Shih, T.-F. Yeh, J.-P. Huang, Angew. Chem. 1996, 108, 2609-2620; Angew. Chem. Int. Ed. Engl. 1996, 35, 2428-2440.
48. General reviews on photoresists: a) E. Reichmanis, L. F. Thompson, Chem. Rev. 1989, 89, 1273-1289; b) R. D. Miller, G. M. Wallraff, Adv. Mater. Opt. Electron. 1994, 4, 95-127; c) A. Reiser, H.-Y. Shih, T.-F. Yeh, J.-P. Huang, Angew. Chem. 1996, 108, 2609-2620; Angew. Chem. Int. Ed. Engl. 1996, 35, 2428-2440.
49. General reviews on photoresists: a) E. Reichmanis, L. F. Thompson, Chem. Rev. 1989, 89, 1273-1289; b) R. D. Miller, G. M. Wallraff, Adv. Mater. Opt. Electron. 1994, 4, 95-127; c) A. Reiser, H.-Y. Shih, T.-F. Yeh, J.-P. Huang, Angew. Chem. 1996, 108, 2609-2620; Angew. Chem. Int. Ed. Engl. 1996, 35, 2428-2440.
50. General reviews on photoresists: a) E. Reichmanis, L. F. Thompson, Chem. Rev. 1989, 89, 1273-1289; b) R. D. Miller, G. M. Wallraff, Adv. Mater. Opt. Electron. 1994, 4, 95-127; c) A. Reiser, H.-Y. Shih, T.-F. Yeh, J.-P. Huang, Angew. Chem. 1996, 108, 2609-2620; Angew. Chem. Int. Ed. Engl. 1996, 35, 2428-2440.
51. Injection molding on the micrometer scale: a) P. E. J. Legierse, J. H. T. Pasman in Polymers in Information Storage Technology, Plenum, New York, 1989, p. 155; b) W. Michaeli, R. Bielzer, Adv. Mater. 1991, 3, 260-262; c) T. E. Huber, L. Luo, Appl. Phys. Lett. 1997, 70, 2502-2504.
52. Injection molding on the micrometer scale: a) P. E. J. Legierse, J. H. T. Pasman in Polymers in Information Storage Technology, Plenum, New York, 1989, p. 155; b) W. Michaeli, R. Bielzer, Adv. Mater. 1991, 3, 260-262; c) T. E. Huber, L. Luo, Appl. Phys. Lett. 1997, 70, 2502-2504.
53. Injection molding on the micrometer scale: a) P. E. J. Legierse, J. H. T. Pasman in Polymers in Information Storage Technology, Plenum, New York, 1989, p. 155; b) W. Michaeli, R. Bielzer, Adv. Mater. 1991, 3, 260-262; c) T. E. Huber, L. Luo, Appl. Phys. Lett. 1997, 70, 2502-2504.
54. Injection molding on the nanometer scale: a) P. Hoyer, N. Baba, H. Masuda, Appl. Phys. Lett. 1995, 66, 2700-2702; b) H. Masuda, K. Fukuda, Science 1995, 268, 1466-1468; c) P. Hoyer, Adv. Mater. 1996, 8, 857-859.
55. Injection molding on the nanometer scale: a) P. Hoyer, N. Baba, H. Masuda, Appl. Phys. Lett. 1995, 66, 2700-2702; b) H. Masuda, K. Fukuda, Science 1995, 268, 1466-1468; c) P. Hoyer, Adv. Mater. 1996, 8, 857-859.
56. Injection molding on the nanometer scale: a) P. Hoyer, N. Baba, H. Masuda, Appl. Phys. Lett. 1995, 66, 2700-2702; b) H. Masuda, K. Fukuda, Science 1995, 268, 1466-1468; c) P. Hoyer, Adv. Mater. 1996, 8, 857-859.
57. Embossing on the micrometer scale: a) J. S. Winslow, IEEE Trans. Consumer Electron. 1976 (Nov.), 318-326; b) H. W. Lehmann, R. Widmer, M. Ebnoether, A. Wokaun, M. Meier, S. K. Miller, J. Vac. Sci. Technol. B 1983, 1, 1207-1210; c) C. M. Rodia, Proc. SPIE Int. Soc. Opt. Eng. 1985, 529, 69-75; d) K.-H. Schlereth, H. Bötther, J. Vac. Sci. Technol. B 1992, 10, 114-117; e) M. Emmelius, G. Pawlowski, H. W. Vollmann, Angew. Chem. 1989, 101, 1475-1501; Angew. Chem. Int. Ed. Engl. 1989, 28, 1445-1471; f) F. P. Shvartsman in Diffractive and Miniaturized Optics (Ed.: S.-H. Lee), SPIE Optical Engineering Press, Bellingham, WA, 1993, pp. 165-186.
58. Embossing on the micrometer scale: a) J. S. Winslow, IEEE Trans. Consumer Electron. 1976 (Nov.), 318-326; b) H. W. Lehmann, R. Widmer, M. Ebnoether, A. Wokaun, M. Meier, S. K. Miller, J. Vac. Sci. Technol. B 1983, 1, 1207-1210; c) C. M. Rodia, Proc. SPIE Int. Soc. Opt. Eng. 1985, 529, 69-75; d) K.-H. Schlereth, H. Bötther, J. Vac. Sci. Technol. B 1992, 10, 114-117; e) M. Emmelius, G. Pawlowski, H. W. Vollmann, Angew. Chem. 1989, 101, 1475-1501; Angew. Chem. Int. Ed. Engl. 1989, 28, 1445-1471; f) F. P. Shvartsman in Diffractive and Miniaturized Optics (Ed.: S.-H. Lee), SPIE Optical Engineering Press, Bellingham, WA, 1993, pp. 165-186.
59. Embossing on the micrometer scale: a) J. S. Winslow, IEEE Trans. Consumer Electron. 1976 (Nov.), 318-326; b) H. W. Lehmann, R. Widmer, M. Ebnoether, A. Wokaun, M. Meier, S. K. Miller, J. Vac. Sci. Technol. B 1983, 1, 1207-1210; c) C. M. Rodia, Proc. SPIE Int. Soc. Opt. Eng. 1985, 529, 69-75; d) K.-H. Schlereth, H. Bötther, J. Vac. Sci. Technol. B 1992, 10, 114-117; e) M. Emmelius, G. Pawlowski, H. W. Vollmann, Angew. Chem. 1989, 101, 1475-1501; Angew. Chem. Int. Ed. Engl. 1989, 28, 1445-1471; f) F. P. Shvartsman in Diffractive and Miniaturized Optics (Ed.: S.-H. Lee), SPIE Optical Engineering Press, Bellingham, WA, 1993, pp. 165-186.
60. Embossing on the micrometer scale: a) J. S. Winslow, IEEE Trans. Consumer Electron. 1976 (Nov.), 318-326; b) H. W. Lehmann, R. Widmer, M. Ebnoether, A. Wokaun, M. Meier, S. K. Miller, J. Vac. Sci. Technol. B 1983, 1, 1207-1210; c) C. M. Rodia, Proc. SPIE Int. Soc. Opt. Eng. 1985, 529, 69-75; d) K.-H. Schlereth, H. Bötther, J. Vac. Sci. Technol. B 1992, 10, 114-117; e) M. Emmelius, G. Pawlowski, H. W. Vollmann, Angew. Chem. 1989, 101, 1475-1501; Angew. Chem. Int. Ed. Engl. 1989, 28, 1445-1471; f) F. P. Shvartsman in Diffractive and Miniaturized Optics (Ed.: S.-H. Lee), SPIE Optical Engineering Press, Bellingham, WA, 1993, pp. 165-186.
61. Embossing on the micrometer scale: a) J. S. Winslow, IEEE Trans. Consumer Electron. 1976 (Nov.), 318-326; b) H. W. Lehmann, R. Widmer, M. Ebnoether, A. Wokaun, M. Meier, S. K. Miller, J. Vac. Sci. Technol. B 1983, 1, 1207-1210; c) C. M. Rodia, Proc. SPIE Int. Soc. Opt. Eng. 1985, 529, 69-75; d) K.-H. Schlereth, H. Bötther, J. Vac. Sci. Technol. B 1992, 10, 114-117; e) M. Emmelius, G. Pawlowski, H. W. Vollmann, Angew. Chem. 1989, 101, 1475-1501; Angew. Chem. Int. Ed. Engl. 1989, 28, 1445-1471; f) F. P. Shvartsman in Diffractive and Miniaturized Optics (Ed.: S.-H. Lee), SPIE Optical Engineering Press, Bellingham, WA, 1993, pp. 165-186.
62. Embossing on the micrometer scale: a) J. S. Winslow, IEEE Trans. Consumer Electron. 1976 (Nov.), 318-326; b) H. W. Lehmann, R. Widmer, M. Ebnoether, A. Wokaun, M. Meier, S. K. Miller, J. Vac. Sci. Technol. B 1983, 1, 1207-1210; c) C. M. Rodia, Proc. SPIE Int. Soc. Opt. Eng. 1985, 529, 69-75; d) K.-H. Schlereth, H. Bötther, J. Vac. Sci. Technol. B 1992, 10, 114-117; e) M. Emmelius, G. Pawlowski, H. W. Vollmann, Angew. Chem. 1989, 101, 1475-1501; Angew. Chem. Int. Ed. Engl. 1989, 28, 1445-1471; f) F. P. Shvartsman in Diffractive and Miniaturized Optics (Ed.: S.-H. Lee), SPIE Optical Engineering Press, Bellingham, WA, 1993, pp. 165-186.
63. Embossing on the micrometer scale: a) J. S. Winslow, IEEE Trans. Consumer Electron. 1976 (Nov.), 318-326; b) H. W. Lehmann, R. Widmer, M. Ebnoether, A. Wokaun, M. Meier, S. K. Miller, J. Vac. Sci. Technol. B 1983, 1, 1207-1210; c) C. M. Rodia, Proc. SPIE Int. Soc. Opt. Eng. 1985, 529, 69-75; d) K.-H. Schlereth, H. Bötther, J. Vac. Sci. Technol. B 1992, 10, 114-117; e) M. Emmelius, G. Pawlowski, H. W. Vollmann, Angew. Chem. 1989, 101, 1475-1501; Angew. Chem. Int. Ed. Engl. 1989, 28, 1445-1471; f) F. P. Shvartsman in Diffractive and Miniaturized Optics (Ed.: S.-H. Lee), SPIE Optical Engineering Press, Bellingham, WA, 1993, pp. 165-186.
64. Embossing on the nanometer scale: a) S. Y. Chou, P. R. Krauss, P. J. Renstrom, Appl. Phys. Lett. 1995, 67, 3114-3116; b) Science 1996, 272, 85-87; c) M. T. Gale in Micro-Optics: Elements, Systems and Applications (Ed.: H. P. Herzig), Taylor & Francis, London, 1997, pp. 153-179.
65. Embossing on the nanometer scale: a) S. Y. Chou, P. R. Krauss, P. J. Renstrom, Appl. Phys. Lett. 1995, 67, 3114-3116; b) Science 1996, 272, 85-87; c) M. T. Gale in Micro-Optics: Elements, Systems and Applications (Ed.: H. P. Herzig), Taylor & Francis, London, 1997, pp. 153-179.
66. Embossing on the nanometer scale: a) S. Y. Chou, P. R. Krauss, P. J. Renstrom, Appl. Phys. Lett. 1995, 67, 3114-3116; b) Science 1996, 272, 85-87; c) M. T. Gale in Micro-Optics: Elements, Systems and Applications (Ed.: H. P. Herzig), Taylor & Francis, London, 1997, pp. 153-179.
67. Cast molding on the micrometer scale: a) H. C. Haverkorn van Rijsewijk, P. E. J. Legierse, G. E. Thomas, Philips Tech. Rev. 1982, 40, 287-297; b) J. G. Kloosterboer, G. J. M. Lippits, H. C. Meinders, ibid. 1982, 40, 198-309.
68. Cast molding on the micrometer scale: a) H. C. Haverkorn van Rijsewijk, P. E. J. Legierse, G. E. Thomas, Philips Tech. Rev. 1982, 40, 287-297; b) J. G. Kloosterboer, G. J. M. Lippits, H. C. Meinders, ibid. 1982, 40, 198-309.
69. Cast molding on the nanometer scale: B. D. Terris, H. J. Mamin, M. E. Best, J. A. Logan, D. Rugar, Appl. Phys. Lett. 1996, 69, 4262-4264.
70. Laser ablation on the micrometer scale: a) U. Reblan, H. Endert, G. Zaal, Laser Focus World 1994, 30, 91-96; b) S. A. Weiss, Photonics Spectra 1995, 29(10), 108-114; c) M. A. Roberts, J. S. Rossier, P. Bercier, H. Giault, Anal. Chem. 1997, 69, 2035-2042.
71. Laser ablation on the micrometer scale: a) U. Reblan, H. Endert, G. Zaal, Laser Focus World 1994, 30, 91-96; b) S. A. Weiss, Photonics Spectra 1995, 29(10), 108-114; c) M. A. Roberts, J. S. Rossier, P. Bercier, H. Giault, Anal. Chem. 1997, 69, 2035-2042.
72. Laser ablation on the micrometer scale: a) U. Reblan, H. Endert, G. Zaal, Laser Focus World 1994, 30, 91-96; b) S. A. Weiss, Photonics Spectra 1995, 29(10), 108-114; c) M. A. Roberts, J. S. Rossier, P. Bercier, H. Giault, Anal. Chem. 1997, 69, 2035-2042.
73. Laser ablation on the nanometer scale: a) D. Y. Kim, S. K. Tripathy, L. Li, J. Kumar, Appl. Phys. Lett. 1995, 66, 1166-1168; b) M. Müllenborn, H. Dirac, J. W. Peterson, ibid. 1995, 66, 3001-3003; c) N. Kramer, M. Niesten, C. Schönenberger, ibid. 1995, 67, 2989-2991.
74. Laser ablation on the nanometer scale: a) D. Y. Kim, S. K. Tripathy, L. Li, J. Kumar, Appl. Phys. Lett. 1995, 66, 1166-1168; b) M. Müllenborn, H. Dirac, J. W. Peterson, ibid. 1995, 66, 3001-3003; c) N. Kramer, M. Niesten, C. Schönenberger, ibid. 1995, 67, 2989-2991.
75. Laser ablation on the nanometer scale: a) D. Y. Kim, S. K. Tripathy, L. Li, J. Kumar, Appl. Phys. Lett. 1995, 66, 1166-1168; b) M. Müllenborn, H. Dirac, J. W. Peterson, ibid. 1995, 66, 3001-3003; c) N. Kramer, M. Niesten, C. Schönenberger, ibid. 1995, 67, 2989-2991.
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86. General reviews and highlights on ink-jet printing: a) M. Döring, Philips Tech. Rev. 1982, 40, 192-198; b) E. Anczurowski, J. Oliver, R. H. Marchessault, CHEMTECH 1986, 16(5), 304-310; c) C. Wu, Sci. News 1997, 151, 205.
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88. General reviews and highlights on ink-jet printing: a) M. Döring, Philips Tech. Rev. 1982, 40, 192-198; b) E. Anczurowski, J. Oliver, R. H. Marchessault, CHEMTECH 1986, 16(5), 304-310; c) C. Wu, Sci. News 1997, 151, 205.
89. Application of ink-jet printing in combinatorial systhesis: a) A. P. Blanchard, R. J. Kaiser, L. E. Hood, Biosens. Bioelectron. 1996, 11, 687-690; b) A. V. Lemmo, J. T. Fisher, H. M. Geysen, D. J. Rose, Anal. Chem. 1997, 69, 543-551.
90. Application of ink-jet printing in combinatorial systhesis: a) A. P. Blanchard, R. J. Kaiser, L. E. Hood, Biosens. Bioelectron. 1996, 11, 687-690; b) A. V. Lemmo, J. T. Fisher, H. M. Geysen, D. J. Rose, Anal. Chem. 1997, 69, 543-551.
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93. a) D. C. Neckers, CHEMTECH 1990, 20(10), 616-619;
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95. c) F. T. Wallenberger, Science 1995, 267, 1274-1275;
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97. Short reviews on soft lithography: a) Y. Xia, Dissertation, Harvard University, USA, 1996; b) X.-M. Zhao, Y. Xia, G. M. Whitesides, J. Mater. Chem. 1997, 7, 1069-1074; c) D. Qin, Y. Xia, J. A. Rogers, R. J. Jackman, X.-M. Zhao, G. M. Whitesides, Top. Curr. Chem. 1998, 194, 1-20; d) G. M. Whitesides, Y. Xia, Annu. Rev. Mater. Sci. 1998, 28, 153-184.
98. Short reviews on soft lithography: a) Y. Xia, Dissertation, Harvard University, USA, 1996; b) X.-M. Zhao, Y. Xia, G. M. Whitesides, J. Mater. Chem. 1997, 7, 1069-1074; c) D. Qin, Y. Xia, J. A. Rogers, R. J. Jackman, X.-M. Zhao, G. M. Whitesides, Top. Curr. Chem. 1998, 194, 1-20; d) G. M. Whitesides, Y. Xia, Annu. Rev. Mater. Sci. 1998, 28, 153-184.
99. Short reviews on soft lithography: a) Y. Xia, Dissertation, Harvard University, USA, 1996; b) X.-M. Zhao, Y. Xia, G. M. Whitesides, J. Mater. Chem. 1997, 7, 1069-1074; c) D. Qin, Y. Xia, J. A. Rogers, R. J. Jackman, X.-M. Zhao, G. M. Whitesides, Top. Curr. Chem. 1998, 194, 1-20; d) G. M. Whitesides, Y. Xia, Annu. Rev. Mater. Sci. 1998, 28, 153-184.
100. Short reviews on soft lithography: a) Y. Xia, Dissertation, Harvard University, USA, 1996; b) X.-M. Zhao, Y. Xia, G. M. Whitesides, J. Mater. Chem. 1997, 7, 1069-1074; c) D. Qin, Y. Xia, J. A. Rogers, R. J. Jackman, X.-M. Zhao, G. M. Whitesides, Top. Curr. Chem. 1998, 194, 1-20; d) G. M. Whitesides, Y. Xia, Annu. Rev. Mater. Sci. 1998, 28, 153-184.
101. A. Kumar, G. M. Whitesides, Appl. Phys. Lett. 1993, 63, 2002-2004.
102. Y. Xia, E. Kim, X.-M. Zhao, J. A. Rogers, M. Prentiss, G. M. Whitesides, Science 1996, 273, 347-349.
103. X.-M. Zhao, Y. Xia, G. M. Whitesides, Adv. Mater. 1996, 8, 837-840.
104. E. Kim, Y. Xia, G. M. Whitesides, Nature 1995, 376, 581-584.
105. E. Kim, Y. Xia, X.-M. Zhao, G. M. Whitesides. Adv. Mater. 1997, 9, 651-654.
106. General reviews on SAMs: a) C. D. Bain, G. M. Whitesides, Angew. Chem. 1989, 101, 522-528; Angew. Chem. Int. Ed. Engl. 1989, 28, 506-512; b) G. M. Whitesides, P. E. Laibinis, Langmuir 1990, 6, 87-96; c) A. Ulman, Introduction to Thin Organic Films: From Langmuir-Blodgett to Self-Assembly, Academic Press, Boston, 1991; d) J. D. Swalen, Annu. Rev. Mater. Sci. 1991, 21, 373-408; e) L. H. Dubois, R. G. Nuzzo, Annu. Rev. Phys. Chem. 1992, 43, 437-463.
107. General reviews on SAMs: a) C. D. Bain, G. M. Whitesides, Angew. Chem. 1989, 101, 522-528; Angew. Chem. Int. Ed. Engl. 1989, 28, 506-512; b) G. M. Whitesides, P. E. Laibinis, Langmuir 1990, 6, 87-96; c) A. Ulman, Introduction to Thin Organic Films: From Langmuir-Blodgett to Self-Assembly, Academic Press, Boston, 1991; d) J. D. Swalen, Annu. Rev. Mater. Sci. 1991, 21, 373-408; e) L. H. Dubois, R. G. Nuzzo, Annu. Rev. Phys. Chem. 1992, 43, 437-463.
108. General reviews on SAMs: a) C. D. Bain, G. M. Whitesides, Angew. Chem. 1989, 101, 522-528; Angew. Chem. Int. Ed. Engl. 1989, 28, 506-512; b) G. M. Whitesides, P. E. Laibinis, Langmuir 1990, 6, 87-96; c) A. Ulman, Introduction to Thin Organic Films: From Langmuir-Blodgett to Self-Assembly, Academic Press, Boston, 1991; d) J. D. Swalen, Annu. Rev. Mater. Sci. 1991, 21, 373-408; e) L. H. Dubois, R. G. Nuzzo, Annu. Rev. Phys. Chem. 1992, 43, 437-463.
109. General reviews on SAMs: a) C. D. Bain, G. M. Whitesides, Angew. Chem. 1989, 101, 522-528; Angew. Chem. Int. Ed. Engl. 1989, 28, 506-512; b) G. M. Whitesides, P. E. Laibinis, Langmuir 1990, 6, 87-96; c) A. Ulman, Introduction to Thin Organic Films: From Langmuir-Blodgett to Self-Assembly, Academic Press, Boston, 1991; d) J. D. Swalen, Annu. Rev. Mater. Sci. 1991, 21, 373-408; e) L. H. Dubois, R. G. Nuzzo, Annu. Rev. Phys. Chem. 1992, 43, 437-463.
110. General reviews on SAMs: a) C. D. Bain, G. M. Whitesides, Angew. Chem. 1989, 101, 522-528; Angew. Chem. Int. Ed. Engl. 1989, 28, 506-512; b) G. M. Whitesides, P. E. Laibinis, Langmuir 1990, 6, 87-96; c) A. Ulman, Introduction to Thin Organic Films: From Langmuir-Blodgett to Self-Assembly, Academic Press, Boston, 1991; d) J. D. Swalen, Annu. Rev. Mater. Sci. 1991, 21, 373-408; e) L. H. Dubois, R. G. Nuzzo, Annu. Rev. Phys. Chem. 1992, 43, 437-463.
111. General reviews on SAMs: a) C. D. Bain, G. M. Whitesides, Angew. Chem. 1989, 101, 522-528; Angew. Chem. Int. Ed. Engl. 1989, 28, 506-512; b) G. M. Whitesides, P. E. Laibinis, Langmuir 1990, 6, 87-96; c) A. Ulman, Introduction to Thin Organic Films: From Langmuir-Blodgett to Self-Assembly, Academic Press, Boston, 1991; d) J. D. Swalen, Annu. Rev. Mater. Sci. 1991, 21, 373-408; e) L. H. Dubois, R. G. Nuzzo, Annu. Rev. Phys. Chem. 1992, 43, 437-463.
112. General reviews on self-assembly: a) J.-M. Lehn. Angew. Chem. 1990, 102, 1347-1362; Angew. Chem. Int. Ed. Engl. 1990, 29, 1304-1319; b) G. M. Whitesides, J. P. Mathias, C. T. Seto, Science 1991, 254, 1312-1319; c) G. M. Whitesides, Sci. Am. 1995, 273(9), 146-149.
113. General reviews on self-assembly: a) J.-M. Lehn. Angew. Chem. 1990, 102, 1347-1362; Angew. Chem. Int. Ed. Engl. 1990, 29, 1304-1319; b) G. M. Whitesides, J. P. Mathias, C. T. Seto, Science 1991, 254, 1312-1319; c) G. M. Whitesides, Sci. Am. 1995, 273(9), 146-149.
114. General reviews on self-assembly: a) J.-M. Lehn. Angew. Chem. 1990, 102, 1347-1362; Angew. Chem. Int. Ed. Engl. 1990, 29, 1304-1319; b) G. M. Whitesides, J. P. Mathias, C. T. Seto, Science 1991, 254, 1312-1319; c) G. M. Whitesides, Sci. Am. 1995, 273(9), 146-149.
115. General reviews on self-assembly: a) J.-M. Lehn. Angew. Chem. 1990, 102, 1347-1362; Angew. Chem. Int. Ed. Engl. 1990, 29, 1304-1319; b) G. M. Whitesides, J. P. Mathias, C. T. Seto, Science 1991, 254, 1312-1319; c) G. M. Whitesides, Sci. Am. 1995, 273(9), 146-149.
116. a) T. E. Creigton, Proteins: Structures and Molecular Properties. Freeman, New York, 1983;
117. b) W. Sanger, Principles of Nucleic Acid Structures. Springer, New York. 1986;
118. c) H. Ringsdorf, B. Schlarb, J. Venzmer, Angew. Chem. 1988, 100, 117-162; Angew. Chem. Int. Ed. Engl. 1988, 27, 113-158.
119. c) H. Ringsdorf, B. Schlarb, J. Venzmer, Angew. Chem. 1988, 100, 117-162; Angew. Chem. Int. Ed. Engl. 1988, 27, 113-158.
120. Self-assembly on the molecular scale: a) J.-M. Lehn, Angew. Chem. 1988, 100, 91-114; Angew. Chem. Int. Ed. Engl. 1988, 27, 89-112; b) J. S. Lindsey, New J. Chem. 1991, 15, 153-180; c) E. E. Simanek, J. P. Mathias, C. T. Seto, D. Chin, M. Mammen, D. M. Gordon, G. M. Whitesides, Acc. Chem. Res. 1995, 28, 37-44; d) V. Percec, J. Heck, G. Johansson, D. Tornazos, M. Kawosumi, Pure Appl. Chem. 1994, A31, 1031-1070.
121. Self-assembly on the molecular scale: a) J.-M. Lehn, Angew. Chem. 1988, 100, 91-114; Angew. Chem. Int. Ed. Engl. 1988, 27, 89-112; b) J. S. Lindsey, New J. Chem. 1991, 15, 153-180; c) E. E. Simanek, J. P. Mathias, C. T. Seto, D. Chin, M. Mammen, D. M. Gordon, G. M. Whitesides, Acc. Chem. Res. 1995, 28, 37-44; d) V. Percec, J. Heck, G. Johansson, D. Tornazos, M. Kawosumi, Pure Appl. Chem. 1994, A31, 1031-1070.
122. Self-assembly on the molecular scale: a) J.-M. Lehn, Angew. Chem. 1988, 100, 91-114; Angew. Chem. Int. Ed. Engl. 1988, 27, 89-112; b) J. S. Lindsey, New J. Chem. 1991, 15, 153-180; c) E. E. Simanek, J. P. Mathias, C. T. Seto, D. Chin, M. Mammen, D. M. Gordon, G. M. Whitesides, Acc. Chem. Res. 1995, 28, 37-44; d) V. Percec, J. Heck, G. Johansson, D. Tornazos, M. Kawosumi, Pure Appl. Chem. 1994, A31, 1031-1070.
123. Self-assembly on the molecular scale: a) J.-M. Lehn, Angew. Chem. 1988, 100, 91-114; Angew. Chem. Int. Ed. Engl. 1988, 27, 89-112; b) J. S. Lindsey, New J. Chem. 1991, 15, 153-180; c) E. E. Simanek, J. P. Mathias, C. T. Seto, D. Chin, M. Mammen, D. M. Gordon, G. M. Whitesides, Acc. Chem. Res. 1995, 28, 37-44; d) V. Percec, J. Heck, G. Johansson, D. Tornazos, M. Kawosumi, Pure Appl. Chem. 1994, A31, 1031-1070.
124. Self-assembly on the molecular scale: a) J.-M. Lehn, Angew. Chem. 1988, 100, 91-114; Angew. Chem. Int. Ed. Engl. 1988, 27, 89-112; b) J. S. Lindsey, New J. Chem. 1991, 15, 153-180; c) E. E. Simanek, J. P. Mathias, C. T. Seto, D. Chin, M. Mammen, D. M. Gordon, G. M. Whitesides, Acc. Chem. Res. 1995, 28, 37-44; d) V. Percec, J. Heck, G. Johansson, D. Tornazos, M. Kawosumi, Pure Appl. Chem. 1994, A31, 1031-1070.
125. Self-assembly on the nanometer scale: a) C. A. Mirkin, R. L. Letsinger, R. C. Mucic, J. J. Storhuff, Nature 1996, 382, 607-609; b) A. P. Alivisator, K. P. Johnsson, X. Peng, T. E. Wilson, C. J. Loweth, M. P. Bruchez, Jr., P. G. Schurtz, Nature 1996, 382, 609-611.
126. Self-assembly on the nanometer scale: a) C. A. Mirkin, R. L. Letsinger, R. C. Mucic, J. J. Storhuff, Nature 1996, 382, 607-609; b) A. P. Alivisator, K. P. Johnsson, X. Peng, T. E. Wilson, C. J. Loweth, M. P. Bruchez, Jr., P. G. Schurtz, Nature 1996, 382, 609-611.
127. Self-assembly on the micrometer scale: a) A. S. Dimitov, K. Nagayama, Langmuir 1996, 12, 1303-1311; b) M. Trau, S. Sankaran, D. A. Saville, I. A. Aksay, Nature 1995, 374, 437-439; c) S.-R. Yeh, M. Seul, B. I. Shraiman, ibid. 1997, 386, 57-59; d) A. van Blaaderen, R. Ruel, P. Wiltzius, ibid. 1997, 385, 321-324.
128. Self-assembly on the micrometer scale: a) A. S. Dimitov, K. Nagayama, Langmuir 1996, 12, 1303-1311; b) M. Trau, S. Sankaran, D. A. Saville, I. A. Aksay, Nature 1995, 374, 437-439; c) S.-R. Yeh, M. Seul, B. I. Shraiman, ibid. 1997, 386, 57-59; d) A. van Blaaderen, R. Ruel, P. Wiltzius, ibid. 1997, 385, 321-324.
129. Self-assembly on the micrometer scale: a) A. S. Dimitov, K. Nagayama, Langmuir 1996, 12, 1303-1311; b) M. Trau, S. Sankaran, D. A. Saville, I. A. Aksay, Nature 1995, 374, 437-439; c) S.-R. Yeh, M. Seul, B. I. Shraiman, ibid. 1997, 386, 57-59; d) A. van Blaaderen, R. Ruel, P. Wiltzius, ibid. 1997, 385, 321-324.
130. Self-assembly on the micrometer scale: a) A. S. Dimitov, K. Nagayama, Langmuir 1996, 12, 1303-1311; b) M. Trau, S. Sankaran, D. A. Saville, I. A. Aksay, Nature 1995, 374, 437-439; c) S.-R. Yeh, M. Seul, B. I. Shraiman, ibid. 1997, 386, 57-59; d) A. van Blaaderen, R. Ruel, P. Wiltzius, ibid. 1997, 385, 321-324.
131. Self-assembly on the millimeter scale: a) A. Terfort, N. Bowden, G. M. Whitesides, Nature 1997, 386, 162-164; b) N. Bowden, A. Terfort, J. Carbeck, G. M. Whitesides, Science 1997, 276, 233-235.
132. Self-assembly on the millimeter scale: a) A. Terfort, N. Bowden, G. M. Whitesides, Nature 1997, 386, 162-164; b) N. Bowden, A. Terfort, J. Carbeck, G. M. Whitesides, Science 1997, 276, 233-235.
133. Recent reviews on SAMs: a) J. Xu, H.-L. Li, J. Coll. Interf. Sci. 1995, 176, 138-149; b) A. Ulman, MRS Bull. 1995, 30(6), 46-51; c) A. R. Bishop, R. G. Nuzzo, Curr. Opin. Coll. Interf. Sci. 1996, 1, 127-136; d) E. Delamarche, B. Michel, H. A. Biebuyck, C. Gerber, Adv. Mater. 1996, 8, 719-729.
134. Recent reviews on SAMs: a) J. Xu, H.-L. Li, J. Coll. Interf. Sci. 1995, 176, 138-149; b) A. Ulman, MRS Bull. 1995, 30(6), 46-51; c) A. R. Bishop, R. G. Nuzzo, Curr. Opin. Coll. Interf. Sci. 1996, 1, 127-136; d) E. Delamarche, B. Michel, H. A. Biebuyck, C. Gerber, Adv. Mater. 1996, 8, 719-729.
135. Recent reviews on SAMs: a) J. Xu, H.-L. Li, J. Coll. Interf. Sci. 1995, 176, 138-149; b) A. Ulman, MRS Bull. 1995, 30(6), 46-51; c) A. R. Bishop, R. G. Nuzzo, Curr. Opin. Coll. Interf. Sci. 1996, 1, 127-136; d) E. Delamarche, B. Michel, H. A. Biebuyck, C. Gerber, Adv. Mater. 1996, 8, 719-729.
136. Recent reviews on SAMs: a) J. Xu, H.-L. Li, J. Coll. Interf. Sci. 1995, 176, 138-149; b) A. Ulman, MRS Bull. 1995, 30(6), 46-51; c) A. R. Bishop, R. G. Nuzzo, Curr. Opin. Coll. Interf. Sci. 1996, 1, 127-136; d) E. Delamarche, B. Michel, H. A. Biebuyck, C. Gerber, Adv. Mater. 1996, 8, 719-729.
137. See, for example, a) P. Fenter, A. Eberhardt, P. Eisenberger, Science 1994, 266, 1216-1218; b) E. Delamarche, B. Michel, H. Kang, C. Gerber, Langmuir 1994, 10, 4103-4108; c) S. V. Atre, B. Liedberg, D. L. Allara, ibid. 1995, 11, 3882-3893; d) P. Wagner, M. Hegner, H.-J. Güntherodt, G. Sernenza, ibid. 1995, 11, 3867-3875.
138. See, for example, a) P. Fenter, A. Eberhardt, P. Eisenberger, Science 1994, 266, 1216-1218; b) E. Delamarche, B. Michel, H. Kang, C. Gerber, Langmuir 1994, 10, 4103-4108; c) S. V. Atre, B. Liedberg, D. L. Allara, ibid. 1995, 11, 3882-3893; d) P. Wagner, M. Hegner, H.-J. Güntherodt, G. Sernenza, ibid. 1995, 11, 3867-3875.
139. See, for example, a) P. Fenter, A. Eberhardt, P. Eisenberger, Science 1994, 266, 1216-1218; b) E. Delamarche, B. Michel, H. Kang, C. Gerber, Langmuir 1994, 10, 4103-4108; c) S. V. Atre, B. Liedberg, D. L. Allara, ibid. 1995, 11, 3882-3893; d) P. Wagner, M. Hegner, H.-J. Güntherodt, G. Sernenza, ibid. 1995, 11, 3867-3875.
140. See, for example, a) P. Fenter, A. Eberhardt, P. Eisenberger, Science 1994, 266, 1216-1218; b) E. Delamarche, B. Michel, H. Kang, C. Gerber, Langmuir 1994, 10, 4103-4108; c) S. V. Atre, B. Liedberg, D. L. Allara, ibid. 1995, 11, 3882-3893; d) P. Wagner, M. Hegner, H.-J. Güntherodt, G. Sernenza, ibid. 1995, 11, 3867-3875.
141. See, for example, a) H. A. Biebuyck, G. M. Whitesides, Langmuir 1994, 10, 1825-1831; b) H. Schönherr, H. Ringsdorf, ibid. 1996, 12, 3891-3897.
142. See, for example, a) H. A. Biebuyck, G. M. Whitesides, Langmuir 1994, 10, 1825-1831; b) H. Schönherr, H. Ringsdorf, ibid. 1996, 12, 3891-3897.
143. E. B. Throughton, C. D. Bain, G. M. Whitesides, R. G. Nuzzo, D. L. Allara, M. D. Porter, Langmuir 1988, 4, 365-385.
144. J. E. Chadwick, D. C. Myles, R. L. Garrell, J. Am. Chem. Soc. 1993, 115, 10364-10365.
145. K. Uvdal, I. Persson, B. Liedberg, Langmuir 1995, 11, 1252-1256.
146. See, for example, a) P. Fenter, P. Eisenberger, J. Li, N. Camillone III, S. Bernasek, G. Scoles, T. A. Ramnanarayanan, K. S. Liang, Langmuir 1991, 7, 2013-2016; b) A. Dhirani, M. A. Hines, A. J. Fisher, O. Ismail, P. Guyot-Sionnest, ibid. 1995, 11, 2609-2614.
147. See, for example, a) P. Fenter, P. Eisenberger, J. Li, N. Camillone III, S. Bernasek, G. Scoles, T. A. Ramnanarayanan, K. S. Liang, Langmuir 1991, 7, 2013-2016; b) A. Dhirani, M. A. Hines, A. J. Fisher, O. Ismail, P. Guyot-Sionnest, ibid. 1995, 11, 2609-2614.
148. See, for example, a) H. Keller, P. Sirnak, W. Schrepp, J. Dembowski, Thin Solid Films 1994, 244, 799-805; b) M. Itoh, K. Nishihara, K. Aramaki, J. Electrochem. Soc. 1995, 142, 3696-3704; c) J. B. Schlenoff, M. Li, H. Ly, J. Am. Chem. Soc. 1995, 117, 12528-12536.
149. See, for example, a) H. Keller, P. Sirnak, W. Schrepp, J. Dembowski, Thin Solid Films 1994, 244, 799-805; b) M. Itoh, K. Nishihara, K. Aramaki, J. Electrochem. Soc. 1995, 142, 3696-3704; c) J. B. Schlenoff, M. Li, H. Ly, J. Am. Chem. Soc. 1995, 117, 12528-12536.
150. See, for example, a) H. Keller, P. Sirnak, W. Schrepp, J. Dembowski, Thin Solid Films 1994, 244, 799-805; b) M. Itoh, K. Nishihara, K. Aramaki, J. Electrochem. Soc. 1995, 142, 3696-3704; c) J. B. Schlenoff, M. Li, H. Ly, J. Am. Chem. Soc. 1995, 117, 12528-12536.
151. T. R. Lee, P. E. Laibinis, J. P. Folkers, G. M. Whitesides, Pure Appl. Chem. 1991, 65, 821-828.
152. J. J. Hickman, P. E. Laibinis, D. I. Auerbach, C. Zou, T. J. Gardner, G. M. Whitesides, M. S. Wrighton, Langmuir 1992, 8, 357-359.
153. See, for example, a) C. W. Sheen, J.-X. Shi, J. Martensson, A. N. Parikh, D. L. Allara, J. Am. Chem. Soc. 1992, 114, 1514-1515; b) C. D. Bain, Adv. Mater. 1992, 4, 591-594; c) J. F. Dorsten, J. E. Maslar, P. W. Bohn, Appl. Phys. Lett. 1995, 66, 1755-1757.
154. See, for example, a) C. W. Sheen, J.-X. Shi, J. Martensson, A. N. Parikh, D. L. Allara, J. Am. Chem. Soc. 1992, 114, 1514-1515; b) C. D. Bain, Adv. Mater. 1992, 4, 591-594; c) J. F. Dorsten, J. E. Maslar, P. W. Bohn, Appl. Phys. Lett. 1995, 66, 1755-1757.
155. See, for example, a) C. W. Sheen, J.-X. Shi, J. Martensson, A. N. Parikh, D. L. Allara, J. Am. Chem. Soc. 1992, 114, 1514-1515; b) C. D. Bain, Adv. Mater. 1992, 4, 591-594; c) J. F. Dorsten, J. E. Maslar, P. W. Bohn, Appl. Phys. Lett. 1995, 66, 1755-1757.
156. Y. Gu, Z. Lin, R. A. Butera, V. S. Smentkowski, D. H. Waldeck, Langmuir 1995, 11, 1849-1851.
157. See, for example, a) M. J. Wirth, R. W. P. Fairbank, H. O. Fatunmbi, Science 1997, 275, 44-47; b) J. B. Brzoska, I. B. Azouz, F. Rondelez, Langmuir 1994, 10, 4367-4373; c) D. L. Allara, A.N. Parikh, F. Rondelez, ibid. 1995, 11, 2357-2360.
158. See, for example, a) M. J. Wirth, R. W. P. Fairbank, H. O. Fatunmbi, Science 1997, 275, 44-47; b) J. B. Brzoska, I. B. Azouz, F. Rondelez, Langmuir 1994, 10, 4367-4373; c) D. L. Allara, A.N. Parikh, F. Rondelez, ibid. 1995, 11, 2357-2360.
159. See, for example, a) M. J. Wirth, R. W. P. Fairbank, H. O. Fatunmbi, Science 1997, 275, 44-47; b) J. B. Brzoska, I. B. Azouz, F. Rondelez, Langmuir 1994, 10, 4367-4373; c) D. L. Allara, A.N. Parikh, F. Rondelez, ibid. 1995, 11, 2357-2360.
160. M. R. Linford, C. E. D. Chidsey, J. Am. Chem. Soc. 1993, 115, 12631-12632.
161. M. R. Linford, P. Fenter, P. M. Eisenberger, C. E. D. Chidsey, J. Am. Chem. Soc. 1995, 117, 3145-3155.
162. A. Bansal, X. Li, I. Lauermann, N. S. Lewis, S. I. Yi, W. H. Weinberg, J. Am. Chem. Soc. 1996, 118, 7225-7226.
163. See, for example, a) D. L. Allara, R. G. Nuzzo, Langmuir 1985, 1, 54-71; b) P. E. Laibinis, J. J. Hickinan, M. S. Wrighton, G. M. Whitesides, Science 1989, 245, 845-847; c) Y.-T. Tao, M.-T. Lee, S.-C. Chang, J. Am. Chem. Soc. 1993, 115, 9547-9555.
164. See, for example, a) D. L. Allara, R. G. Nuzzo, Langmuir 1985, 1, 54-71; b) P. E. Laibinis, J. J. Hickinan, M. S. Wrighton, G. M. Whitesides, Science 1989, 245, 845-847; c) Y.-T. Tao, M.-T. Lee, S.-C. Chang, J. Am. Chem. Soc. 1993, 115, 9547-9555.
165. See, for example, a) D. L. Allara, R. G. Nuzzo, Langmuir 1985, 1, 54-71; b) P. E. Laibinis, J. J. Hickinan, M. S. Wrighton, G. M. Whitesides, Science 1989, 245, 845-847; c) Y.-T. Tao, M.-T. Lee, S.-C. Chang, J. Am. Chem. Soc. 1993, 115, 9547-9555.
166. J. P. Folkers, C. B. Gorman, P. E. Laibinis, S. Buchholz, G. M. Whitesides, R. G. Nuzzo, Langmuir 1995, 11, 813-824.
167. Reviews: a) G. Cao, H.-G. Hong, T. E. Mallouk, Acc. Chem. Res. 1992, 25, 420-427; b) M. E. Thompson, Chem. Mater. 1994, 6, 1168-1175; c) H. E. Katz, ibid. 1994, 6, 2227-2232.
168. Reviews: a) G. Cao, H.-G. Hong, T. E. Mallouk, Acc. Chem. Res. 1992, 25, 420-427; b) M. E. Thompson, Chem. Mater. 1994, 6, 1168-1175; c) H. E. Katz, ibid. 1994, 6, 2227-2232.
169. Reviews: a) G. Cao, H.-G. Hong, T. E. Mallouk, Acc. Chem. Res. 1992, 25, 420-427; b) M. E. Thompson, Chem. Mater. 1994, 6, 1168-1175; c) H. E. Katz, ibid. 1994, 6, 2227-2232.
170. T. J. Gardner, C. D. Frisbie, M. S. Wrighton, J. Am. Chem. Soc. 1995, 117, 6927-6933.
171. A recent review on STM studies: G. E. Polner, Chem. Rev. 1997, 97, 1117-1127.
172. Recent AFM studies: a) C. A. Alves, E. L. Smith, M. D. Porter, J. Am. Chem. Soc. 1992, 114, 1222-1227; b) G.-Y. Liu, M. B. Salmeron, Langmuir 1994, 10, 367-370.
173. Recent AFM studies: a) C. A. Alves, E. L. Smith, M. D. Porter, J. Am. Chem. Soc. 1992, 114, 1222-1227; b) G.-Y. Liu, M. B. Salmeron, Langmuir 1994, 10, 367-370.
174. See, for example, M. R. Anderson, M. N. Evaniak, M. Zhang, Langmuir 1996, 12, 294-300.
175. See, for example, N. Camillone III, T. Y. B. Leung, P. Schwartz, P. Eisenberger, G. Scoles, Langmuir 1996, 12, 2737-2746.
176. See, for example, W. B. Caldwell, D. J. Campbell, K. Chen, B. R. Herr, C. A. Mirkin, A. Malik, M. K. Durbin, P. Dutta, K. G. Huang, J. Am. Chem. Soc. 1995, 117, 6071-6082.
177. See, for example, L. Strong, G. M. Whitesides, Langmuir 1988, 4, 546-558.
178. M. A. Bryant, J. E. Pemberton, J. Am. Chem. Soc. 1991, 113, 3629-3637.
179. See, for example, a) Q. Du, E. Freysz, Y. R. Shen, Science 1994, 264, 826-828; b) C. D. Bain, J. Chem. Soc. Faraday Trans. 1995, 91, 1281-1296.
180. See, for example, a) Q. Du, E. Freysz, Y. R. Shen, Science 1994, 264, 826-828; b) C. D. Bain, J. Chem. Soc. Faraday Trans. 1995, 91, 1281-1296.
181. See, for example, J. P. Folkers, P. E. Laibinis, G. M. Whitesides, Langmuir 1992, 8, 1330-1341.
182. L. H. Dubois, B. R. Zegarski, R. G. Nuzzo, J. Am. Chem. Soc. 1990, 112, 570-579.
183. See, for example, a) Y. Li, J. Huang, R. T. McIver, Jr., J. C. Hemminger, J. Am. Chem. Soc. 1992, 114, 2428-2432; b) M. J. Tarlov, J. G. Newman, Langmuir 1992, 8, 1398-1405; c) T. D. McCarley, R. L. McCarley, Anal. Chem. 1997, 69, 130-136.
184. See, for example, a) Y. Li, J. Huang, R. T. McIver, Jr., J. C. Hemminger, J. Am. Chem. Soc. 1992, 114, 2428-2432; b) M. J. Tarlov, J. G. Newman, Langmuir 1992, 8, 1398-1405; c) T. D. McCarley, R. L. McCarley, Anal. Chem. 1997, 69, 130-136.
185. See, for example, a) Y. Li, J. Huang, R. T. McIver, Jr., J. C. Hemminger, J. Am. Chem. Soc. 1992, 114, 2428-2432; b) M. J. Tarlov, J. G. Newman, Langmuir 1992, 8, 1398-1405; c) T. D. McCarley, R. L. McCarley, Anal. Chem. 1997, 69, 130-136.
186. See, for example, a) C. D. Bain, G. M. Whitesides, J. Am. Chem. Soc. 1988, 110, 3665-3666; b) D. J. Olbris, A. Ulman, Y. Shnidman, J. Chem. Phys. 1995, 102, 6885-6873.
187. See, for example, a) C. D. Bain, G. M. Whitesides, J. Am. Chem. Soc. 1988, 110, 3665-3666; b) D. J. Olbris, A. Ulman, Y. Shnidman, J. Chem. Phys. 1995, 102, 6885-6873.
188. See, for example, C. D. Bain, E. B. Throughton, Y.-T. Tao, J. Evall, G. M. Whitesides, R. G. Nuzzo, J. Am. Chem. Soc. 1989, 111, 321-335.
189. See, for example, a) D. A. Buttry, M. D. Ward, Chem. Rev. 1992, 92, 1355-1379;
190. b) T. W. Schneider, D. A. Buttry, J. Am. Chem. Soc. 1993, 115, 12391-12397; c) D. S. Karpovich, G. J. Blanchard, Langmuir 1994, 10, 3315-3322; d) C. Fruböss, K. Doblhofer, J. Chem. Soc. Faraday Trans. 1995, 91, 1949-1953.
191. b) T. W. Schneider, D. A. Buttry, J. Am. Chem. Soc. 1993, 115, 12391-12397; c) D. S. Karpovich, G. J. Blanchard, Langmuir 1994, 10, 3315-3322; d) C. Fruböss, K. Doblhofer, J. Chem. Soc. Faraday Trans. 1995, 91, 1949-1953.
192. b) T. W. Schneider, D. A. Buttry, J. Am. Chem. Soc. 1993, 115, 12391-12397; c) D. S. Karpovich, G. J. Blanchard, Langmuir 1994, 10, 3315-3322; d) C. Fruböss, K. Doblhofer, J. Chem. Soc. Faraday Trans. 1995, 91, 1949-1953.
193. M. D. Ward, D. A. Buttry, Science 1990, 249, 1000-1007.
194. See, for example, a) S. Li, R. M. Crooks, Langmuir 1993, 9, 1951-1954; b) A. Badia, R. Back, R. B. Lennox, Angew. Chem. 1994, 106, 2429-2432; Angew. Chem. Int. Ed. Engl. 1994, 33, 2332-2335; c) F. P. Zamborini, R. M. Crooks, Langmuir 1997, 13, 122-126.
195. See, for example, a) S. Li, R. M. Crooks, Langmuir 1993, 9, 1951-1954; b) A. Badia, R. Back, R. B. Lennox, Angew. Chem. 1994, 106, 2429-2432; Angew. Chem. Int. Ed. Engl. 1994, 33, 2332-2335; c) F. P. Zamborini, R. M. Crooks, Langmuir 1997, 13, 122-126.
196. See, for example, a) S. Li, R. M. Crooks, Langmuir 1993, 9, 1951-1954; b) A. Badia, R. Back, R. B. Lennox, Angew. Chem. 1994, 106, 2429-2432; Angew. Chem. Int. Ed. Engl. 1994, 33, 2332-2335; c) F. P. Zamborini, R. M. Crooks, Langmuir 1997, 13, 122-126.
197. See, for example, a) S. Li, R. M. Crooks, Langmuir 1993, 9, 1951-1954; b) A. Badia, R. Back, R. B. Lennox, Angew. Chem. 1994, 106, 2429-2432; Angew. Chem. Int. Ed. Engl. 1994, 33, 2332-2335; c) F. P. Zamborini, R. M. Crooks, Langmuir 1997, 13, 122-126.
198. X.-M. Zhao, J. L. Wilbur, G. M. Whitesides, Langmuir 1996, 12, 3257-3264.
199. General reviews on interactions between SAMs and proteins/cells: a) M. Mrksich, G. M. Whitesides, TIBTECH 1995, 13, 228-235; b) Annu. Rev. Biophys. Biomol. Struc. 1996, 25, 55-78.
200. General reviews on interactions between SAMs and proteins/cells: a) M. Mrksich, G. M. Whitesides, TIBTECH 1995, 13, 228-235; b) Annu. Rev. Biophys. Biomol. Struc. 1996, 25, 55-78.
201. Previous reviews on microcontact printers: a) J. L. Wilbur, A. Kumar, E. Kim, G. M. Whitesides, Adv. Mater. 1994, 6, 600-604; b) A. Kurnar, N. L. Abbott, E. Kim, H. A. Biebuyck, G. M. Whitesides, Acc. Chem. Res. 1995, 219, 219-226; c) G. M. Whitesides, C. B. Gorman in Handbook of Surface Imaging and Visualization (Ed.: A. T. Hubbard), CRC Press, Boca Raton, FL, 1995, pp. 713-733; d) J. L. Wilbur, A. Kumar, H. A. Biebuyck, E. Kim, G. M. Whitesides, Nanotechnology 1996, 7, 452-457; e) Y. Xia, X.-M. Zhao, G. M. Whitesides, Microelectron. Eng. 1996, 32, 255-268; f) H. A. Biebuyck, N. B. Larsen, E. Delamarche, B. Michel, IBM J. Res. Dev. 1997, 41, 159-170.
202. Previous reviews on microcontact printers: a) J. L. Wilbur, A. Kumar, E. Kim, G. M. Whitesides, Adv. Mater. 1994, 6, 600-604; b) A. Kurnar, N. L. Abbott, E. Kim, H. A. Biebuyck, G. M. Whitesides, Acc. Chem. Res. 1995, 219, 219-226; c) G. M. Whitesides, C. B. Gorman in Handbook of Surface Imaging and Visualization (Ed.: A. T. Hubbard), CRC Press, Boca Raton, FL, 1995, pp. 713-733; d) J. L. Wilbur, A. Kumar, H. A. Biebuyck, E. Kim, G. M. Whitesides, Nanotechnology 1996, 7, 452-457; e) Y. Xia, X.-M. Zhao, G. M. Whitesides, Microelectron. Eng. 1996, 32, 255-268; f) H. A. Biebuyck, N. B. Larsen, E. Delamarche, B. Michel, IBM J. Res. Dev. 1997, 41, 159-170.
203. Previous reviews on microcontact printers: a) J. L. Wilbur, A. Kumar, E. Kim, G. M. Whitesides, Adv. Mater. 1994, 6, 600-604; b) A. Kurnar, N. L. Abbott, E. Kim, H. A. Biebuyck, G. M. Whitesides, Acc. Chem. Res. 1995, 219, 219-226; c) G. M. Whitesides, C. B. Gorman in Handbook of Surface Imaging and Visualization (Ed.: A. T. Hubbard), CRC Press, Boca Raton, FL, 1995, pp. 713-733; d) J. L. Wilbur, A. Kumar, H. A. Biebuyck, E. Kim, G. M. Whitesides, Nanotechnology 1996, 7, 452-457; e) Y. Xia, X.-M. Zhao, G. M. Whitesides, Microelectron. Eng. 1996, 32, 255-268; f) H. A. Biebuyck, N. B. Larsen, E. Delamarche, B. Michel, IBM J. Res. Dev. 1997, 41, 159-170.
204. Previous reviews on microcontact printers: a) J. L. Wilbur, A. Kumar, E. Kim, G. M. Whitesides, Adv. Mater. 1994, 6, 600-604; b) A. Kurnar, N. L. Abbott, E. Kim, H. A. Biebuyck, G. M. Whitesides, Acc. Chem. Res. 1995, 219, 219-226; c) G. M. Whitesides, C. B. Gorman in Handbook of Surface Imaging and Visualization (Ed.: A. T. Hubbard), CRC Press, Boca Raton, FL, 1995, pp. 713-733; d) J. L. Wilbur, A. Kumar, H. A. Biebuyck, E. Kim, G. M. Whitesides, Nanotechnology 1996, 7, 452-457; e) Y. Xia, X.-M. Zhao, G. M. Whitesides, Microelectron. Eng. 1996, 32, 255-268; f) H. A. Biebuyck, N. B. Larsen, E. Delamarche, B. Michel, IBM J. Res. Dev. 1997, 41, 159-170.
205. Previous reviews on microcontact printers: a) J. L. Wilbur, A. Kumar, E.
206. Previous reviews on microcontact printers: a) J. L. Wilbur, A. Kumar, E. Kim, G. M. Whitesides, Adv. Mater. 1994, 6, 600-604; b) A. Kurnar, N. L. Abbott, E. Kim, H. A. Biebuyck, G. M. Whitesides, Acc. Chem. Res. 1995, 219, 219-226; c) G. M. Whitesides, C. B. Gorman in Handbook of Surface Imaging and Visualization (Ed.: A. T. Hubbard), CRC Press, Boca Raton, FL, 1995, pp. 713-733; d) J. L. Wilbur, A. Kumar, H. A. Biebuyck, E. Kim, G. M. Whitesides, Nanotechnology 1996, 7, 452-457; e) Y. Xia, X.-M. Zhao, G. M. Whitesides, Microelectron. Eng. 1996, 32, 255-268; f) H. A. Biebuyck, N. B. Larsen, E. Delamarche, B. Michel, IBM J. Res. Dev. 1997, 41, 159-170.
207. Microprinting of alkanethiols on gold: A. Kumar, H. Biebuyck, G. M. Whitesides, Langmuir 1994, 10, 1498-1511.
208. Microprinting of alkanethiols on silver: a) Y. Xia, E. Kim, G. M. Whitesides, J. Electrochem. Soc. 1996, 143, 1070-1079; b) X. M. Yang, A. A. Tryk, K. Hasimoto, A. Fujishima, Appl. Phys. Lett. 1996, 69, 4020-4022.
209. Microprinting of alkanethiols on silver: a) Y. Xia, E. Kim, G. M. Whitesides, J. Electrochem. Soc. 1996, 143, 1070-1079; b) X. M. Yang, A. A. Tryk, K. Hasimoto, A. Fujishima, Appl. Phys. Lett. 1996, 69, 4020-4022.
210. Microprinting of alkanethiols on copper: a) T. P. Moffat, H. Yang, J. Electrochem. Soc. 1995, 142, L220-L222; b) Y. Xia, E. Kim, M. Mrksich, G. M. Whitesides, Chem. Mater. 1996, 8, 601-603.
211. Microprinting of alkanethiols on copper: a) T. P. Moffat, H. Yang, J. Electrochem. Soc. 1995, 142, L220-L222; b) Y. Xia, E. Kim, M. Mrksich, G. M. Whitesides, Chem. Mater. 1996, 8, 601-603.
212. Microprinting of alkanethiols on palladium: L. Goetting, N.-L. Jeon, G. M. Whitesides, unpublished results.
213. 3: L. Goetting, G. M. Whitesides, unpublished results.
214. 2: a) Y. Xia, M. Mrksich, E. Kim, G. M. Whitesides, J. Am. Chem. Soc. 1995, 117, 9576-9577; b) P. M. St. John, H. G. Craighead, Appl. Phys. Lett. 1996, 68, 1022-1024; c) D. Wang, S. G. Thomas, K. L. Wang, Y. Xia, G. M. Whitesides, ibid. 1997, 70, 1593-1595.
215. 2: a) Y. Xia, M. Mrksich, E. Kim, G. M. Whitesides, J. Am. Chem. Soc. 1995, 117, 9576-9577; b) P. M. St. John, H. G. Craighead, Appl. Phys. Lett. 1996, 68, 1022-1024; c) D. Wang, S. G. Thomas, K. L. Wang, Y. Xia, G. M. Whitesides, ibid. 1997, 70, 1593-1595.
216. 2: a) Y. Xia, M. Mrksich, E. Kim, G. M. Whitesides, J. Am. Chem. Soc. 1995, 117, 9576-9577; b) P. M. St. John, H. G. Craighead, Appl. Phys. Lett. 1996, 68, 1022-1024; c) D. Wang, S. G. Thomas, K. L. Wang, Y. Xia, G. M. Whitesides, ibid. 1997, 70, 1593-1595.
217. Photooxidation of alkanethiolate SAMs on gold: a) J. Huang, J. C. Hemminger, J. Am. Chem. Soc. 1993, 115, 3342-3343; b) M. J. Tarlov, D. R. F. Burgess, Jr., G. Gillen, ibid. 1993, 115, 5305-5306; c) J. Huang, D. A. Dahlgren, J. C. Hemminger, Langmuir 1994, 10, 626-628; d) S.-W. Tam-Chang, H. A. Biebuyck, G. M. Whitesides, N. Jeon, R. G. Nuzzo, ibid. 1995, 11, 4371-4382; e) D. A. Hutt, E. Cooper, L. Parker, G. J. Leggett, T. L. Parker, ibid. 1996, 12, 5494-5497.
218. Photooxidation of alkanethiolate SAMs on gold: a) J. Huang, J. C. Hemminger, J. Am. Chem. Soc. 1993, 115, 3342-3343; b) M. J. Tarlov, D. R. F. Burgess, Jr., G. Gillen, ibid. 1993, 115, 5305-5306; c) J. Huang, D. A. Dahlgren, J. C. Hemminger, Langmuir 1994, 10, 626-628; d) S.-W. Tam-Chang, H. A. Biebuyck, G. M. Whitesides, N. Jeon, R. G. Nuzzo, ibid. 1995, 11, 4371-4382; e) D. A. Hutt, E. Cooper, L. Parker, G. J. Leggett, T. L. Parker, ibid. 1996, 12, 5494-5497.
219. Photooxidation of alkanethiolate SAMs on gold: a) J. Huang, J. C. Hemminger, J. Am. Chem. Soc. 1993, 115, 3342-3343; b) M. J. Tarlov, D. R. F. Burgess, Jr., G. Gillen, ibid. 1993, 115, 5305-5306; c) J. Huang, D. A. Dahlgren, J. C. Hemminger, Langmuir 1994, 10, 626-628; d) S.-W. Tam-Chang, H. A. Biebuyck, G. M. Whitesides, N. Jeon, R. G. Nuzzo, ibid. 1995, 11, 4371-4382; e) D. A. Hutt, E. Cooper, L. Parker, G. J. Leggett, T. L. Parker, ibid. 1996, 12, 5494-5497.
220. Photooxidation of alkanethiolate SAMs on gold: a) J. Huang, J. C. Hemminger, J. Am. Chem. Soc. 1993, 115, 3342-3343; b) M. J. Tarlov, D. R. F. Burgess, Jr., G. Gillen, ibid. 1993, 115, 5305-5306; c) J. Huang, D. A. Dahlgren, J. C. Hemminger, Langmuir 1994, 10, 626-628; d) S.-W. Tam-Chang, H. A. Biebuyck, G. M. Whitesides, N. Jeon, R. G. Nuzzo, ibid. 1995, 11, 4371-4382; e) D. A. Hutt, E. Cooper, L. Parker, G. J. Leggett, T. L. Parker, ibid. 1996, 12, 5494-5497.
221. Photooxidation of alkanethiolate SAMs on gold: a) J. Huang, J. C. Hemminger, J. Am. Chem. Soc. 1993, 115, 3342-3343; b) M. J. Tarlov, D. R. F. Burgess, Jr., G. Gillen, ibid. 1993, 115, 5305-5306; c) J. Huang, D. A. Dahlgren, J. C. Hemminger, Langmuir 1994, 10, 626-628; d) S.-W. Tam-Chang, H. A. Biebuyck, G. M. Whitesides, N. Jeon, R. G. Nuzzo, ibid. 1995, 11, 4371-4382; e) D. A. Hutt, E. Cooper, L. Parker, G. J. Leggett, T. L. Parker, ibid. 1996, 12, 5494-5497.
222. Photo-cross-linking of alkanethiolate SAMs on gold: a) K. C. Chan, T. Kim, J. K. Schoer, R. M. Crooks, J. Am. Chem. Soc. 1995, 117, 5875-5876; b) T. Kim, K. C. Chan, R. M. Crooks, ibid. 1997, 119, 189-193.
223. Photo-cross-linking of alkanethiolate SAMs on gold: a) K. C. Chan, T. Kim, J. K. Schoer, R. M. Crooks, J. Am. Chem. Soc. 1995, 117, 5875-5876; b) T. Kim, K. C. Chan, R. M. Crooks, ibid. 1997, 119, 189-193.
224. Photoactivation of alkanethiolate SAMs on gold: a) E. W. Wollman, C. D. Frisbie, M. S. Wrighton, Langmuir 1993, 9, 1517-1520; b) D. J. Pritchard, H. Morgan, J. M. Cooper, Angew. Chem. 1995, 107, 84-86; Angew. Chem. Int. Ed. Engl. 1995, 34, 91-93.
225. Photoactivation of alkanethiolate SAMs on gold: a) E. W. Wollman, C. D. Frisbie, M. S. Wrighton, Langmuir 1993, 9, 1517-1520; b) D. J. Pritchard, H. Morgan, J. M. Cooper, Angew. Chem. 1995, 107, 84-86; Angew. Chem. Int. Ed. Engl. 1995, 34, 91-93.
226. Photoactivation of alkanethiolate SAMs on gold: a) E. W. Wollman, C. D. Frisbie, M. S. Wrighton, Langmuir 1993, 9, 1517-1520; b) D. J. Pritchard, H. Morgan, J. M. Cooper, Angew. Chem. 1995, 107, 84-86; Angew. Chem. Int. Ed. Engl. 1995, 34, 91-93.
227. See, for example, A. C. Pease, D. Solas, E. J. Sullivan, M. T. Cronin, C. P. Holmes, S. P. A. Fodor, Proc. Natl. Acad. Sci. USA 1994, 91, 5022-5026.
228. Recent reviews: a) W. J. Dressick, J. M. Calvert, Jpn. J. Appl. Phys. 1993, 32, 5829-5839; b) J. M. Calvert, Thin Films 1995, 20, 109-141.
229. Recent reviews: a) W. J. Dressick, J. M. Calvert, Jpn. J. Appl. Phys. 1993, 32, 5829-5839; b) J. M. Calvert, Thin Films 1995, 20, 109-141.
230. J. A. M. Sondag-Huethorst, H. R. J. van Helleputte, L. G. Fokkink, Appl. Phys. Lett. 1994, 64, 285-287.
231. M. Lercel, R. C. Tiberio, P. F. Chapman, H. G. Craighead, C. W. Sheen, A. N. Parikh, D. L. Allara, J. Vac. Sci. Technol. B 1993, 11, 2823-2828.
232. M. J. Lercel, H. G. Craighead, A. N. Parikh, K. Seshadri, A. L. Allara, Appl. Phys. Lett. 1996, 68, 1504-1506.
233. G. Gillen, S. Wight, J. Bennett, M. J. Tarlov, Appl. Phys. Lett. 1994, 65, 534-536.
234. a) K. K. Berggren, A. Bard, J. L. Wilbur, J. D. Gillaspy, A. G. Heig, J. J. McClelland, S. L. Rolston, W. D. Phillips, M. Prentiss, G. M. Whitesides, Science 1995, 269, 1255-1257;
235. b) K. K. Berggren, R. Younkin, E. Cheung, M. Prentiss, A. J. Black, G. M. Whitesides, D. C. Ralph, O. T. Black, M. Tinkham, Adv. Mater. 1997, 9, 52-55.
236. K. S. Johnson, K. K. Berggren, A. J. Black, A. P. Chu, N. H. Dekker, D. C. Ralph, J. H. Thywissen, R. Youkin, M. Prentiss, M. Tinkham, G. M. Whitesides, Appl. Phys. Lett. 1996, 69, 2773-2775.
237. See, for example, a) C. B. Ross, L. Sun, R. M. Crooks, Langmuir 1993, 9, 632-636; b) E. Delamarche, A. C. F. Hoole, B. Michel, S. Wilkes, M. Despont, M. E. Weiland, H. Biebuyck, J. Phys. Chem. B 1997, 101, 9263-9269.
238. See, for example, a) C. B. Ross, L. Sun, R. M. Crooks, Langmuir 1993, 9, 632-636; b) E. Delamarche, A. C. F. Hoole, B. Michel, S. Wilkes, M. Despont, M. E. Weiland, H. Biebuyck, J. Phys. Chem. B 1997, 101, 9263-9269.
239. a) N. L. Abbott, J. P. Folkers, G. M. Whitesides, Science 1992, 257, 1380-1382;
240. b) N. L. Abbott, D. R. Rolison, G. M. Whitesides, Langmuir 1994, 8, 267.
241. A. Kumar, H. Biebuyck, N. L. Abbott, G. M. Whitesides, J. Am. Chem. Soc. 1992, 114, 9188-9189.
242. A. Voet, Ink and Paper in the Printing Process. Interscience, New York, 1952.
243. P. O. Hidber, W. Helbig, E. Kim, G. M. Whitesides, Langmuir 1996, 12, 1375-1380.
244. See, for example, a) M. C. Hutley, Diffraction Gratings, Academic Press, New York, 1982; b) B. L. Ramos, S. J. Choquette, Anal. Chem. 1996, 68, 1245-1249.
245. See, for example, a) M. C. Hutley, Diffraction Gratings, Academic Press, New York, 1982; b) B. L. Ramos, S. J. Choquette, Anal. Chem. 1996, 68, 1245-1249.
246. M. Nakano, N. Nishida, Appl. Opt. 1979, 18, 3073-3074.
247. D. A. Kiewit, Rev. Sci. Instrum. 1973, 44, 1741-1742.
248. Replication of features with dimensions below the micron scale has also been used in microscopy to aid in visualizing fragile structures: Electron Microscope Preparation Technology Accessories and Consumable, Bal-TEC Products, Middlebury, CT, 1992, catalogue no. 5B.
249. S. L. Goodman, P. A. Sims, R. M. Albrecht, Biomaterials 1996, 17, 2087-2095.
250. a) F. L. Dickert, S. Thierer, Adv. Mater. 1996, 8, 987-990;
251. b) L. Schweitz, L. I. Anderson, S. Nilsson, Anal. Chem. 1997, 69, 1179-1183;
252. c) D. Kriz, O. Ramström, K. Mosbach, ibid. 1997, 69, 345A-349A;
253. d) C. Pinel, P. Loisil, P. Gallezot, Adv. Mater. 1997, 9, 582-585.
254. a) Siloxane Polymers (Eds.: S. J. Clarson, J. A. Semlyen), Prentice-Hall, Engleword, NJ, 1993;
255. b) J. F. Künzler, Trends Polym. Sci. 1996, 4, 52-59.
256. Y. Xia, N. Venkateswaran, D. Qin, J. Tien, G. M. Whitesides, Langmuir 1998, 14, 363-371.
257. A PDMS block that is about 1 mm thick has a transmittance of about 90% at 325 nm.
258. Elastomeric mirrors and diffraction gratings: J. L. Wilbur, R. J. Jackman, G. M. Whitesides, E. L. Cheung, L. K. Lee, M. G. Prentiss, Chem. Mater. 1996, 8, 1380-1385.
259. Elastomeric optical modulators: a) J. A. Rogers, D. Qin, O. J. A. Schueller, G. M. Whitesides, Rev. Sci. Instrum. 1996, 67, 3310-3319; b) J. A. Rogers, O. J. A. Schueller, C. Marzolin, G. M. Whitesides, Appl. Opt. 1991, 36, 5792-5795.
260. Elastomeric optical modulators: a) J. A. Rogers, D. Qin, O. J. A. Schueller, G. M. Whitesides, Rev. Sci. Instrum. 1996, 67, 3310-3319; b) J. A. Rogers, O. J. A. Schueller, C. Marzolin, G. M. Whitesides, Appl. Opt. 1991, 36, 5792-5795.
261. Elastomeric light valves: D. Qin, Y. Xia, G. M. Whitesides, Adv. Mater. 1997, 9, 407-409.
262. Elastomeric photothermal detectors: J. A. Rogers, R. J. Jackman, O. J. A. Schueller, G. M. Whitesides, Appl. Opt. 1996, 35, 6641-6647.
263. D. Qin, Y. Xia, A. J. Black, G. M. Whitesides, J. Vac. Sci. Technol. B 1998, in press.
264. J. A. Rogers, K. E. Paul, R. J. Jackman, G. M. Whitesides, Appl. Phys. Lett. 1997, 70, 2658-2660; J. Vac. Sci. Technol. B 1998, in press.
265. J. A. Rogers, K. E. Paul, R. J. Jackman, G. M. Whitesides, Appl. Phys. Lett. 1997, 70, 2658-2660; J. Vac. Sci. Technol. B 1998, in press.
266. See for example, a) G. S. Ferguson, M. K. Chaudhury, G. B. Sigal, G. M. Whitesides, Science 1991, 253, 776-778; b) M. K. Chaudhury, G. M. Whitesides, ibid. 1992, 255, 1230-1232; c) G. S. Ferguson, M. K. Chaudhury, H. A. Biebuyck, G. M. Whitesides, Macromolecules 1993, 26, 5870-5875; d) M. K. Chaudhury, Biosens. Bioelectron. 1995, 10, 785-788.
267. See for example, a) G. S. Ferguson, M. K. Chaudhury, G. B. Sigal, G. M. Whitesides, Science 1991, 253, 776-778; b) M. K. Chaudhury, G. M. Whitesides, ibid. 1992, 255, 1230-1232; c) G. S. Ferguson, M. K. Chaudhury, H. A. Biebuyck, G. M. Whitesides, Macromolecules 1993, 26, 5870-5875; d) M. K. Chaudhury, Biosens. Bioelectron. 1995, 10, 785-788.
268. See for example, a) G. S. Ferguson, M. K. Chaudhury, G. B. Sigal, G. M. Whitesides, Science 1991, 253, 776-778; b) M. K. Chaudhury, G. M. Whitesides, ibid. 1992, 255, 1230-1232; c) G. S. Ferguson, M. K. Chaudhury, H. A. Biebuyck, G. M. Whitesides, Macromolecules 1993, 26, 5870-5875; d) M. K. Chaudhury, Biosens. Bioelectron. 1995, 10, 785-788.
269. See for example, a) G. S. Ferguson, M. K. Chaudhury, G. B. Sigal, G. M. Whitesides, Science 1991, 253, 776-778; b) M. K. Chaudhury, G. M. Whitesides, ibid. 1992, 255, 1230-1232; c) G. S. Ferguson, M. K. Chaudhury, H. A. Biebuyck, G. M. Whitesides, Macromolecules 1993, 26, 5870-5875; d) M. K. Chaudhury, Biosens. Bioelectron. 1995, 10, 785-788.
270. See, for example, T. Tanaka, M. Morigami, N. Atoda, Jpn. J. Appl. Phys. 1993, 32, 6059-6061.
271. E. Delamarche, H. Schmid, H. A. Biebuyck, B. Michel, Adv. Mater. 1977, 9, 741-746.
272. For technical reports on thermally curable PDMS resins, see, for example, Dow Corning, Midland, MI, 1986.
273. L. C. DeBolt, J. E. Mark, Macromolecules 1987, 20, 2369-2374.
274. J. A. Rogers, K. Paul, G. M. Whitesides, J. Vac. Sci. Technol, B 1998, in press.
275. Y. Xia, A. Zhuk, G. M. Whitesides, unpublished results.
276. Y. Xia, J. Tien, D. Qin, G. M. Whitesides, Langmuir 1996, 12, 4033-4038.
277. D. Qin, Y. Xia, G. M. Whitesides, Adv. Mater. 1996, 8, 917-919.
278. For the economical production of masks using a desk-top publishing system, see M. Parameswaren, http://www.fas.sfu.ca/ensc/research/ groups/micromachining/file2.html.
279. H. A. Biebuyck, G. M. Whitesides, Langmuir 1994, 10, 4581-4587.
280. N. B. Larsen, H. Biebuyck, E. Delamarche, B. Michel, J. Am. Chem. Soc. 1997, 119, 3017-3026.
281. See, for example, a) G. P. López, H. A. Biebuyck, G. M. Whitesides, Langmuir 1993, 9, 1513-1516; b) G. B. López, H. A. Biebuyck, R. Härter, G. M. Whitesides, J. Am. Chem. Soc. 1993, 115, 10774-10781.
282. See, for example, a) G. P. López, H. A. Biebuyck, G. M. Whitesides, Langmuir 1993, 9, 1513-1516; b) G. B. López, H. A. Biebuyck, R. Härter, G. M. Whitesides, J. Am. Chem. Soc. 1993, 115, 10774-10781.
283. See, for example, a) C. D. Frisbie, L. F. Rozsnyai, A. Noy, M. S. Wrighton, O. M. Lieber, Science 1994, 263, 2071-2073; b) J. L. Wilbur, H. A. Biebuyck, J. C. MacDonald, G. M. Whitesides, Langmuir 1995, 11, 825-831; c) G. Bar, S. Rubin, A. N. Parikh, B. I. Swanson, T. A. Zawodzinski, Jr., M.-H. Whangbo, ibid. 1997, 13, 373-377.
284. See, for example, a) C. D. Frisbie, L. F. Rozsnyai, A. Noy, M. S. Wrighton, O. M. Lieber, Science 1994, 263, 2071-2073; b) J. L. Wilbur, H. A. Biebuyck, J. C. MacDonald, G. M. Whitesides, Langmuir 1995, 11, 825-831; c) G. Bar, S. Rubin, A. N. Parikh, B. I. Swanson, T. A. Zawodzinski, Jr., M.-H. Whangbo, ibid. 1997, 13, 373-377.
285. See, for example, a) C. D. Frisbie, L. F. Rozsnyai, A. Noy, M. S. Wrighton, O. M. Lieber, Science 1994, 263, 2071-2073; b) J. L. Wilbur, H. A. Biebuyck, J. C. MacDonald, G. M. Whitesides, Langmuir 1995, 11, 825-831; c) G. Bar, S. Rubin, A. N. Parikh, B. I. Swanson, T. A. Zawodzinski, Jr., M.-H. Whangbo, ibid. 1997, 13, 373-377.
286. G. P. López, H. A. Biebuyck, C. D. Frisbie, G. M. Whitesides, Science 1993, 260, 647-649.
287. J. Heinze, Angew. Chem. 1993, 105, 1327-1349; Angew. Chem. Int. Ed. Engl. 1993, 32, 1268-1288.
288. J. Heinze, Angew. Chem. 1993, 105, 1327-1349; Angew. Chem. Int. Ed. Engl. 1993, 32, 1268-1288.
289. J. C. C. Tsai in VLSI Technology (Ed.: S. M. Sze), McGraw-Hill, New York, 1988, pp. 272-326.
290. C. Kittel, Introduction to Solid State Physics, 6th ed., Wiley, New York, 1986, p. 110.
291. a) N. L. Jeon, K. Finnie, K. Branshaw, R. G. Nuzzo, Langmuir 1997, 13, 3382-3391;
292. b) A. N. Parikh, M. A. Schivley, E. Koo, K. Seshadri, D. Aurentz, K. Mueller, D. L. Allara, J. Am. Chem. Soc. 1997, 119, 3135-3143.
293. Y. Xia, X.-M. Zhao, E. Kim, G. M. Whitesides, Chem. Mater. 1995, 7, 2332-2337.
294. Selective wetting and dewetting: a) A. Kumar, G. M. Whitesides, Science 1994, 263, 60-62; b) H. A. Biebuyck, G. M. Whitesides, Langmuir 1994, 10, 2790-2793; c) S. Palacin, P. C. Hidber, J.-P. Bourgoin, C. Miramond, C. Fermon, G. M. Whitesides, Chem. Mater. 1996, 8, 1316-1325; d) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, ibid. 1995, 7, 252-254; e) E. Kim, G. M. Whitesides, ibid. 1995, 7, 1257-1264; f) E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 1996, 8, 139-142.
295. Selective wetting and dewetting: a) A. Kumar, G. M. Whitesides, Science 1994, 263, 60-62; b) H. A. Biebuyck, G. M. Whitesides, Langmuir 1994, 10, 2790-2793; c) S. Palacin, P. C. Hidber, J.-P. Bourgoin, C. Miramond, C. Fermon, G. M. Whitesides, Chem. Mater. 1996, 8, 1316-1325; d) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, ibid. 1995, 7, 252-254; e) E. Kim, G. M. Whitesides, ibid. 1995, 7, 1257-1264; f) E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 1996, 8, 139-142.
296. Selective wetting and dewetting: a) A. Kumar, G. M. Whitesides, Science 1994, 263, 60-62; b) H. A. Biebuyck, G. M. Whitesides, Langmuir 1994, 10, 2790-2793; c) S. Palacin, P. C. Hidber, J.-P. Bourgoin, C. Miramond, C. Fermon, G. M. Whitesides, Chem. Mater. 1996, 8, 1316-1325; d) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, ibid. 1995, 7, 252-254; e) E. Kim, G. M. Whitesides, ibid. 1995, 7, 1257-1264; f) E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 1996, 8, 139-142.
297. Selective wetting and dewetting: a) A. Kumar, G. M. Whitesides, Science 1994, 263, 60-62; b) H. A. Biebuyck, G. M. Whitesides, Langmuir 1994, 10, 2790-2793; c) S. Palacin, P. C. Hidber, J.-P. Bourgoin, C. Miramond, C. Fermon, G. M. Whitesides, Chem. Mater. 1996, 8, 1316-1325; d) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, ibid. 1995, 7, 252-254; e) E. Kim, G. M. Whitesides, ibid. 1995, 7, 1257-1264; f) E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 1996, 8, 139-142.
298. Selective wetting and dewetting: a) A. Kumar, G. M. Whitesides, Science 1994, 263, 60-62; b) H. A. Biebuyck, G. M. Whitesides, Langmuir 1994, 10, 2790-2793; c) S. Palacin, P. C. Hidber, J.-P. Bourgoin, C. Miramond, C. Fermon, G. M. Whitesides, Chem. Mater. 1996, 8, 1316-1325; d) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, ibid. 1995, 7, 252-254; e) E. Kim, G. M. Whitesides, ibid. 1995, 7, 1257-1264; f) E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 1996, 8, 139-142.
299. Selective wetting and dewetting: a) A. Kumar, G. M. Whitesides, Science 1994, 263, 60-62; b) H. A. Biebuyck, G. M. Whitesides, Langmuir 1994, 10, 2790-2793; c) S. Palacin, P. C. Hidber, J.-P. Bourgoin, C. Miramond, C. Fermon, G. M. Whitesides, Chem. Mater. 1996, 8, 1316-1325; d) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, ibid. 1995, 7, 252-254; e) E. Kim, G. M. Whitesides, ibid. 1995, 7, 1257-1264; f) E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 1996, 8, 139-142.
300. Selective attachment of cells: a) R. Singhvi, A. Kumar, G. P. Lopez, G. P. Stephanopoulos, D. I. C. Wang, G. M. Whitesides, D. E. Ingber, Science 1994, 264, 696-698; b) M. Mrksich, C. S. Chen, Y. Xia, L. E. Dike, D. E. Ingber, G. M. Whitesides, Proc. Natl. Acad. Sci. USA 1996, 93, 10775-10778; c) C. S. Chen, M. Mrksich, S. Huang, G. M. Whitesides, D. E. Ingber, Science 1997, 276, 1245-1248; d) M. Mrksich, L. E. Dike, J. Tien, D. E. Ingber, G. M. Whitesides, Exp. Cell Res. 1997, 235, 305-313.
301. Selective attachment of cells: a) R. Singhvi, A. Kumar, G. P. Lopez, G. P. Stephanopoulos, D. I. C. Wang, G. M. Whitesides, D. E. Ingber, Science 1994, 264, 696-698; b) M. Mrksich, C. S. Chen, Y. Xia, L. E. Dike, D. E. Ingber, G. M. Whitesides, Proc. Natl. Acad. Sci. USA 1996, 93, 10775-10778; c) C. S. Chen, M. Mrksich, S. Huang, G. M. Whitesides, D. E. Ingber, Science 1997, 276, 1245-1248; d) M. Mrksich, L. E. Dike, J. Tien, D. E. Ingber, G. M. Whitesides, Exp. Cell Res. 1997, 235, 305-313.
302. Selective attachment of cells: a) R. Singhvi, A. Kumar, G. P. Lopez, G. P. Stephanopoulos, D. I. C. Wang, G. M. Whitesides, D. E. Ingber, Science 1994, 264, 696-698; b) M. Mrksich, C. S. Chen, Y. Xia, L. E. Dike, D. E. Ingber, G. M. Whitesides, Proc. Natl. Acad. Sci. USA 1996, 93, 10775-10778; c) C. S. Chen, M. Mrksich, S. Huang, G. M. Whitesides, D. E. Ingber, Science 1997, 276, 1245-1248; d) M. Mrksich, L. E. Dike, J. Tien, D. E. Ingber, G. M. Whitesides, Exp. Cell Res. 1997, 235, 305-313.
303. Selective attachment of cells: a) R. Singhvi, A. Kumar, G. P. Lopez, G. P. Stephanopoulos, D. I. C. Wang, G. M. Whitesides, D. E. Ingber, Science 1994, 264, 696-698; b) M. Mrksich, C. S. Chen, Y. Xia, L. E. Dike, D. E. Ingber, G. M. Whitesides, Proc. Natl. Acad. Sci. USA 1996, 93, 10775-10778; c) C. S. Chen, M. Mrksich, S. Huang, G. M. Whitesides, D. E. Ingber, Science 1997, 276, 1245-1248; d) M. Mrksich, L. E. Dike, J. Tien, D. E. Ingber, G. M. Whitesides, Exp. Cell Res. 1997, 235, 305-313.
304. Selective deposition of polymers: a) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, Chem. Mater. 1995, 7, 526-529; b) P. Hammond, G. M. Whitesides, Macromolecules 1995, 28, 7569-7571; c) C. N. Sayre, D. M. Collard, Langmuir 1997, 13, 714-722; d) J. Mater. Chem. 1997, 7, 909-912; e) Z. Huang, P.-C. Wang, A. G. MacDiarmid, Y. Xia, G. M. Whitesides, Langmuir 1997, 13, 6480-6484.
305. Selective deposition of polymers: a) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, Chem. Mater. 1995, 7, 526-529; b) P. Hammond, G. M. Whitesides, Macromolecules 1995, 28, 7569-7571; c) C. N. Sayre, D. M. Collard, Langmuir 1997, 13, 714-722; d) J. Mater. Chem. 1997, 7, 909-912; e) Z. Huang, P.-C. Wang, A. G. MacDiarmid, Y. Xia, G. M. Whitesides, Langmuir 1997, 13, 6480-6484.
306. Selective deposition of polymers: a) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, Chem. Mater. 1995, 7, 526-529; b) P. Hammond, G. M. Whitesides, Macromolecules 1995, 28, 7569-7571; c) C. N. Sayre, D. M. Collard, Langmuir 1997, 13, 714-722; d) J. Mater. Chem. 1997, 7, 909-912; e) Z. Huang, P.-C. Wang, A. G. MacDiarmid, Y. Xia, G. M. Whitesides, Langmuir 1997, 13, 6480-6484.
307. Selective deposition of polymers: a) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, Chem. Mater. 1995, 7, 526-529; b) P. Hammond, G. M. Whitesides, Macromolecules 1995, 28, 7569-7571; c) C. N. Sayre, D. M. Collard, Langmuir 1997, 13, 714-722; d) J. Mater. Chem. 1997, 7, 909-912; e) Z. Huang, P.-C. Wang, A. G. MacDiarmid, Y. Xia, G. M. Whitesides, Langmuir 1997, 13, 6480-6484.
308. Selective deposition of polymers: a) C. B. Gorman, H. A. Biebuyck, G. M. Whitesides, Chem. Mater. 1995, 7, 526-529; b) P. Hammond, G. M. Whitesides, Macromolecules 1995, 28, 7569-7571; c) C. N. Sayre, D. M. Collard, Langmuir 1997, 13, 714-722; d) J. Mater. Chem. 1997, 7, 909-912; e) Z. Huang, P.-C. Wang, A. G. MacDiarmid, Y. Xia, G. M. Whitesides, Langmuir 1997, 13, 6480-6484.
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