Photo-bias instability of metal oxide thin film transistors for advanced active matrix displays

Journal of Materials Research

Volumn 28, Issue 16, 2013, Pages 2071-2084

  Jeong, Jae Kyeong ^a  

^a Inha University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE MATRIX DISPLAYS; DEGRADATION MECHANISM; DEVICE PERFORMANCE; INFORMATION DISPLAY; LITERATURE REVIEWS; METAL OXIDE THIN-FILM TRANSISTORS; PHOTOIONIZATION MODELS; SILICON-BASED ELECTRONICS;

DEGRADATION; METALLIC COMPOUNDS; OPTOELECTRONIC DEVICES; STABILITY; THIN FILMS;

THIN FILM TRANSISTORS;

EID: 84883281611     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2013.214     Document Type: Review

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