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Volumn 22, Issue 22, 2012, Pages 10994-10998
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Improvement of the photo-bias stability of the Zn-Sn-O field effect transistors by an ozone treatment
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Author keywords
[No Author keywords available]
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Indexed keywords
ADSORBED OXYGEN;
NEGATIVE BIAS;
OXYGEN VACANCY CONCENTRATION;
OZONE TREATMENT;
PHOTON IRRADIATION;
STRESS STABILITY;
THRESHOLD VOLTAGE SHIFTS;
DESORPTION;
OZONE;
STABILITY;
TIN;
ZINC;
FIELD EFFECT TRANSISTORS;
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EID: 84861321784
PISSN: 09599428
EISSN: 13645501
Source Type: Journal
DOI: 10.1039/c2jm30242j Document Type: Article |
Times cited : (85)
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References (31)
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