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Volumn 97, Issue 18, 2010, Pages

Photon-accelerated negative bias instability involving subgap states creation in amorphous In-Ga-Zn-O thin film transistor

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE CHARACTERISTIC; CARRIER DENSITY; DEEP HOLES; FREE CARRIERS; IN-FIELD; NEGATIVE BIAS; NEGATIVE BIAS INSTABILITIES; NEGATIVE SHIFT; SUBTHRESHOLD SWING; TRANSFER CURVES; TURN ON VOLTAGE; VISIBLE LIGHT;

EID: 78649300313     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3510471     Document Type: Article
Times cited : (338)

References (18)
  • 4
    • 38549145327 scopus 로고    scopus 로고
    • 0003-6951,. 10.1063/1.2824758
    • A. Suresh and J. F. Muth, Appl. Phys. Lett. 0003-6951 92, 033502 (2008). 10.1063/1.2824758
    • (2008) Appl. Phys. Lett. , vol.92 , pp. 033502
    • Suresh, A.1    Muth, J.F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.