Threshold voltage instability of amorphous silicon thin-film transistors under constant current stress

Applied Physics Letters

Volumn 87, Issue 2, 2005, Pages

  Jahinuzzaman, Shah M ^a   Sultana, Afrin ^a   Sakariya, Kapil ^a   Servati, Peyman ^a   Nathan, Arokia ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTANT CURRENT; DRAIN CURRENT; POWER LAW;

AMORPHOUS SILICON; CARRIER CONCENTRATION; DEFECTS; ELECTRIC CURRENTS; MATHEMATICAL MODELS; THRESHOLD VOLTAGE;

THIN FILM TRANSISTORS;

EID: 24144462850     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1993766     Document Type: Article

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