Open-loop band excitation Kelvin probe force microscopy

Nanotechnology

Volumn 23, Issue 12, 2012, Pages

  Guo, Senli ^a   Kalinin, Sergei V ^a   Jesse, Stephen ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

KELVIN PROBE FORCE MICROSCOPY; MATERIALS SYSTEMS; OPEN LOOPS; SURFACE ELECTROSTATICS;

FREQUENCY RESPONSE; NATURAL FREQUENCIES; SCANNING PROBE MICROSCOPY;

PROBES;

EID: 84858396485     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/12/125704     Document Type: Article

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