SCOPUS 정보 검색 플랫폼

Advanced Materials

Volumn 18, Issue 2, 2006, Pages 145-164

Electronic characterization of organic thin films by Kelvin probe force microscopy

(3) Palermo, Vincenzo a Palma, Matteo b Samori, Paolo a,b,c

a Istituto per la Sintesi Organica e la Fotoreattività (Italy)

b UNIVERSITÉ LOUIS PASTEUR (France)

c Nano chemistry Laboratory (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ENVIRONMENTAL CONDITIONS; FUNCTIONAL SURFACES; KELVIN PROBE FORCE MICROSCOPY (KPFM);

CHARACTERIZATION; ELECTRIC PROPERTIES; ELECTRONIC PROPERTIES; MICROSCOPIC EXAMINATION; OPTIMIZATION;

THIN FILMS;

EID: 31344433515 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/adma.200501394 Document Type: Review

Times cited : (393)

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