Electronic transport imaging in a multiwire SnO 2 chemical field-effect transistor device

Journal of Applied Physics

Volumn 98, Issue 4, 2005, Pages

  Kalinin, Sergei V ^a   Shin, J ^a   Jesse, S ^a   Geohegan, D ^a   Baddorf, A P ^a   Lilach, Y ^b   Moskovits, M ^c   Kolmakov, A ^d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d SOUTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC TRANSPORT IMAGING; NANOWIRES; SCANNING SURFACE-POTENTIAL MICROSCOOPY (SSPM);

ATOMIC FORCE MICROSCOPY; FIELD EFFECT TRANSISTORS; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

TIN COMPOUNDS;

EID: 25144507524     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2001144     Document Type: Article

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